Quantitative determination of defocus, thickness and composition from high-resolution transmission electron microscopy lattice images.
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| Title: | Quantitative determination of defocus, thickness and composition from high-resolution transmission electron microscopy lattice images. |
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| Authors: | Stenkamp, D., Strunk, H. P. |
| Source: | Applied Physics A: Materials Science & Processing. 1996, Vol. 62 Issue 4, p369. 4p. |
| Subjects: | Crystal lattices, Crystals, Transmission electron microscopy |
| Abstract: | A quantitative method for the direct determination of defocus Δf, local thickness t and local composition x from high-resolution transmission electron microscopy lattice images of wedge-shaped crystal samples is proposed. The method relies on the analytically derived relation between the first-order linear and nonlinear image Fourier coefficients J[sub 1] and J[sub 2] on Δf, t and x. By plotting J[sub 1] vs J[sub 2] for varying t, ellipses with defocus- and composition-specific geometry are obtained. By reconstructing the appropriate ellipse for image regions of homogeneous composition, Δf and t can be determined independently. At interfaces, local compositions x can be determined within the full range 0≤x≤1 by utilizing systematic variations of the ellipse’s geometry with varying x. [ABSTRACT FROM AUTHOR] |
| Copyright of Applied Physics A: Materials Science & Processing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 8825054 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Quantitative determination of defocus, thickness and composition from high-resolution transmission electron microscopy lattice images. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Stenkamp%2C+D%2E%22">Stenkamp, D.</searchLink><br /><searchLink fieldCode="AR" term="%22Strunk%2C+H%2E+P%2E%22">Strunk, H. P.</searchLink> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Applied+Physics+A%3A+Materials+Science+%26+Processing%22">Applied Physics A: Materials Science & Processing</searchLink>. 1996, Vol. 62 Issue 4, p369. 4p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Crystal+lattices%22">Crystal lattices</searchLink><br /><searchLink fieldCode="DE" term="%22Crystals%22">Crystals</searchLink><br /><searchLink fieldCode="DE" term="%22Transmission+electron+microscopy%22">Transmission electron microscopy</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: A quantitative method for the direct determination of defocus Δf, local thickness t and local composition x from high-resolution transmission electron microscopy lattice images of wedge-shaped crystal samples is proposed. The method relies on the analytically derived relation between the first-order linear and nonlinear image Fourier coefficients J[sub 1] and J[sub 2] on Δf, t and x. By plotting J[sub 1] vs J[sub 2] for varying t, ellipses with defocus- and composition-specific geometry are obtained. By reconstructing the appropriate ellipse for image regions of homogeneous composition, Δf and t can be determined independently. At interfaces, local compositions x can be determined within the full range 0≤x≤1 by utilizing systematic variations of the ellipse’s geometry with varying x. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Applied Physics A: Materials Science & Processing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=8825054 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/BF01594235 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 4 StartPage: 369 Subjects: – SubjectFull: Crystal lattices Type: general – SubjectFull: Crystals Type: general – SubjectFull: Transmission electron microscopy Type: general Titles: – TitleFull: Quantitative determination of defocus, thickness and composition from high-resolution transmission electron microscopy lattice images. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Stenkamp, D. – PersonEntity: Name: NameFull: Strunk, H. P. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 04 Text: 1996 Type: published Y: 1996 Identifiers: – Type: issn-print Value: 09478396 Numbering: – Type: volume Value: 62 – Type: issue Value: 4 Titles: – TitleFull: Applied Physics A: Materials Science & Processing Type: main |
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