Bibliographic Details
| Title: |
SEU Sensitivity Comparison for Different Reprogrammable Technologies With Minority Check Block. |
| Authors: |
Vaskova, A.1, Lopez-Ongil, C.1, Portela-Garcia, M.1, Garcia-Valderas, M.1, Entrena, L.1 |
| Source: |
IEEE Transactions on Nuclear Science. Jul2013 Part 1, Vol. 60 Issue 4, p2813-2818. 6p. |
| Subjects: |
Single event effects, Programmable circuits, Comparative studies, Dynamic testing, Sensitivity analysis |
| Abstract: |
In this work, a method is proposed for obtaining comparable measurements of the SEU sensitivity in reprogrammable devices that present different characteristics like internal architecture, technology, amount of available resources, etc. A specific minority checker is developed for reporting the presence of SEUs or MBUs which will help in this comparing task during dynamic tests. [ABSTRACT FROM AUTHOR] |
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| Database: |
Engineering Source |
