SEU Sensitivity Comparison for Different Reprogrammable Technologies With Minority Check Block.
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| Title: | SEU Sensitivity Comparison for Different Reprogrammable Technologies With Minority Check Block. |
|---|---|
| Authors: | Vaskova, A.1, Lopez-Ongil, C.1, Portela-Garcia, M.1, Garcia-Valderas, M.1, Entrena, L.1 |
| Source: | IEEE Transactions on Nuclear Science. Jul2013 Part 1, Vol. 60 Issue 4, p2813-2818. 6p. |
| Subjects: | Single event effects, Programmable circuits, Comparative studies, Dynamic testing, Sensitivity analysis |
| Abstract: | In this work, a method is proposed for obtaining comparable measurements of the SEU sensitivity in reprogrammable devices that present different characteristics like internal architecture, technology, amount of available resources, etc. A specific minority checker is developed for reporting the presence of SEUs or MBUs which will help in this comparing task during dynamic tests. [ABSTRACT FROM AUTHOR] |
| Copyright of IEEE Transactions on Nuclear Science is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 89803197 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/TNS.2013.2245343 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 6 StartPage: 2813 Subjects: – SubjectFull: Single event effects Type: general – SubjectFull: Programmable circuits Type: general – SubjectFull: Comparative studies Type: general – SubjectFull: Dynamic testing Type: general – SubjectFull: Sensitivity analysis Type: general Titles: – TitleFull: SEU Sensitivity Comparison for Different Reprogrammable Technologies With Minority Check Block. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Vaskova, A. – PersonEntity: Name: NameFull: Lopez-Ongil, C. – PersonEntity: Name: NameFull: Portela-Garcia, M. – PersonEntity: Name: NameFull: Garcia-Valderas, M. – PersonEntity: Name: NameFull: Entrena, L. IsPartOfRelationships: – BibEntity: Dates: – D: 10 M: 07 Text: Jul2013 Part 1 Type: published Y: 2013 Identifiers: – Type: issn-print Value: 00189499 Numbering: – Type: volume Value: 60 – Type: issue Value: 4 Titles: – TitleFull: IEEE Transactions on Nuclear Science Type: main |
| ResultId | 1 |
