APA (7th ed.) Citation

Hasse, L. Z., Babicz, S., Kaczmarek, L., Smulko, J. M., & Sedlakova, V. (2014). Quality assessment of ZnO-based varistors by 1/f noise. Microelectronics Reliability, 54(1), 192. https://doi.org/10.1016/j.microrel.2013.09.007

Chicago Style (17th ed.) Citation

Hasse, Lech Z., Sylwia Babicz, Leszek Kaczmarek, Janusz M. Smulko, and Vlasta Sedlakova. "Quality Assessment of ZnO-based Varistors by 1/f Noise." Microelectronics Reliability 54, no. 1 (2014): 192. https://doi.org/10.1016/j.microrel.2013.09.007.

MLA (9th ed.) Citation

Hasse, Lech Z., et al. "Quality Assessment of ZnO-based Varistors by 1/f Noise." Microelectronics Reliability, vol. 54, no. 1, 2014, p. 192, https://doi.org/10.1016/j.microrel.2013.09.007.