View in EDS

Quality assessment of ZnO-based varistors by 1/f noise.

Saved in:
Bibliographic Details
Title: Quality assessment of ZnO-based varistors by 1/f noise.
Authors: Hasse, Lech Z.1 lhasse@eti.pg.gda.pl, Babicz, Sylwia1, Kaczmarek, Leszek1, Smulko, Janusz M.1, Sedlakova, Vlasta2
Source: Microelectronics Reliability. Jan2014, Vol. 54 Issue 1, p192-199. 8p.
Subjects: Zinc oxide, Surge arresters, Varistors, Electric noise, Microelectronics, Semiconductor diodes
Abstract: Highlights: [•] 1/f Noise can be used as a diagnostic tool of surge arrester varistor structures. [•] Noise is a sensitive tool for identification of different grain structures. [•] In diagnostics noise gives more distinctive results than DC characteristics. [•] Noise data can determine technology parameters of the produced varistors. [ABSTRACT FROM AUTHOR]
Copyright of Microelectronics Reliability is the property of Pergamon Press - An Imprint of Elsevier Science and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
FullText Text:
  Availability: 0
Header DbId: egs
DbLabel: Engineering Source
An: 93415705
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Quality assessment of ZnO-based varistors by 1/f noise.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Hasse%2C+Lech+Z%2E%22">Hasse, Lech Z.</searchLink><relatesTo>1</relatesTo><i> lhasse@eti.pg.gda.pl</i><br /><searchLink fieldCode="AR" term="%22Babicz%2C+Sylwia%22">Babicz, Sylwia</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Kaczmarek%2C+Leszek%22">Kaczmarek, Leszek</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Smulko%2C+Janusz+M%2E%22">Smulko, Janusz M.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Sedlakova%2C+Vlasta%22">Sedlakova, Vlasta</searchLink><relatesTo>2</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Microelectronics+Reliability%22">Microelectronics Reliability</searchLink>. Jan2014, Vol. 54 Issue 1, p192-199. 8p.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Zinc+oxide%22">Zinc oxide</searchLink><br /><searchLink fieldCode="DE" term="%22Surge+arresters%22">Surge arresters</searchLink><br /><searchLink fieldCode="DE" term="%22Varistors%22">Varistors</searchLink><br /><searchLink fieldCode="DE" term="%22Electric+noise%22">Electric noise</searchLink><br /><searchLink fieldCode="DE" term="%22Microelectronics%22">Microelectronics</searchLink><br /><searchLink fieldCode="DE" term="%22Semiconductor+diodes%22">Semiconductor diodes</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: Highlights: [•] 1/f Noise can be used as a diagnostic tool of surge arrester varistor structures. [•] Noise is a sensitive tool for identification of different grain structures. [•] In diagnostics noise gives more distinctive results than DC characteristics. [•] Noise data can determine technology parameters of the produced varistors. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Microelectronics Reliability is the property of Pergamon Press - An Imprint of Elsevier Science and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=93415705
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1016/j.microrel.2013.09.007
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 8
        StartPage: 192
    Subjects:
      – SubjectFull: Zinc oxide
        Type: general
      – SubjectFull: Surge arresters
        Type: general
      – SubjectFull: Varistors
        Type: general
      – SubjectFull: Electric noise
        Type: general
      – SubjectFull: Microelectronics
        Type: general
      – SubjectFull: Semiconductor diodes
        Type: general
    Titles:
      – TitleFull: Quality assessment of ZnO-based varistors by 1/f noise.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Hasse, Lech Z.
      – PersonEntity:
          Name:
            NameFull: Babicz, Sylwia
      – PersonEntity:
          Name:
            NameFull: Kaczmarek, Leszek
      – PersonEntity:
          Name:
            NameFull: Smulko, Janusz M.
      – PersonEntity:
          Name:
            NameFull: Sedlakova, Vlasta
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 01
              Text: Jan2014
              Type: published
              Y: 2014
          Identifiers:
            – Type: issn-print
              Value: 00262714
          Numbering:
            – Type: volume
              Value: 54
            – Type: issue
              Value: 1
          Titles:
            – TitleFull: Microelectronics Reliability
              Type: main
ResultId 1