Quality assessment of ZnO-based varistors by 1/f noise.
Saved in:
| Title: | Quality assessment of ZnO-based varistors by 1/f noise. |
|---|---|
| Authors: | Hasse, Lech Z.1 lhasse@eti.pg.gda.pl, Babicz, Sylwia1, Kaczmarek, Leszek1, Smulko, Janusz M.1, Sedlakova, Vlasta2 |
| Source: | Microelectronics Reliability. Jan2014, Vol. 54 Issue 1, p192-199. 8p. |
| Subjects: | Zinc oxide, Surge arresters, Varistors, Electric noise, Microelectronics, Semiconductor diodes |
| Abstract: | Highlights: [•] 1/f Noise can be used as a diagnostic tool of surge arrester varistor structures. [•] Noise is a sensitive tool for identification of different grain structures. [•] In diagnostics noise gives more distinctive results than DC characteristics. [•] Noise data can determine technology parameters of the produced varistors. [ABSTRACT FROM AUTHOR] |
| Copyright of Microelectronics Reliability is the property of Pergamon Press - An Imprint of Elsevier Science and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
Be the first to leave a comment!
