Reliable Concurrent Error Detection Architectures for Extended Euclidean-Based Division Over GF(2^m).
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| Title: | Reliable Concurrent Error Detection Architectures for Extended Euclidean-Based Division Over GF(2^m). |
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| Authors: | Mozaffari-Kermani, Mehran1, Azarderakhsh, Reza2, Lee, Chiou-Yng3, Bayat-Sarmadi, Siavash4 |
| Source: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems. May2014, Vol. 22 Issue 5, p995-1003. 9p. |
| Subjects: | Data encryption, Concurrent error detection, Algorithms, Digital signatures, Euclidean distance, Elliptic curve cryptography, Fault tolerance (Engineering) |
| Abstract: | The extended Euclidean algorithm (EEA) is an important scheme for performing the division operation in finite fields. Many sensitive and security-constrained applications such as those using the elliptic curve cryptography for establishing key agreement schemes, augmented encryption approaches, and digital signature algorithms utilize this operation in their structures. Although much study is performed to realize the EEA in hardware efficiently, research on its reliable implementations needs to be done to achieve fault-immune reliable structures. In this regard, this paper presents a new concurrent error detection (CED) scheme to provide reliability for the aforementioned sensitive and constrained applications. Our proposed CED architecture is a step forward toward more reliable architectures for the EEA algorithm architectures. Through simulations and based on the number of parity bits used, the error detection capability of our CED architecture is derived to be 100% for single-bit errors and close to 99% for the experimented multiple-bit errors. In addition, we present the performance degradations of the proposed approach, leading to low-cost and reliable EEA architectures. The proposed reliable architectures are also suitable for constrained and fault-sensitive embedded applications utilizing the EEA hardware implementations. [ABSTRACT FROM AUTHOR] |
| Copyright of IEEE Transactions on Very Large Scale Integration (VLSI) Systems is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
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| Items | – Name: Title Label: Title Group: Ti Data: Reliable Concurrent Error Detection Architectures for Extended Euclidean-Based Division Over GF(2^m). – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Mozaffari-Kermani%2C+Mehran%22">Mozaffari-Kermani, Mehran</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Azarderakhsh%2C+Reza%22">Azarderakhsh, Reza</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Lee%2C+Chiou-Yng%22">Lee, Chiou-Yng</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Bayat-Sarmadi%2C+Siavash%22">Bayat-Sarmadi, Siavash</searchLink><relatesTo>4</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Very+Large+Scale+Integration+%28VLSI%29+Systems%22">IEEE Transactions on Very Large Scale Integration (VLSI) Systems</searchLink>. May2014, Vol. 22 Issue 5, p995-1003. 9p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Data+encryption%22">Data encryption</searchLink><br /><searchLink fieldCode="DE" term="%22Concurrent+error+detection%22">Concurrent error detection</searchLink><br /><searchLink fieldCode="DE" term="%22Algorithms%22">Algorithms</searchLink><br /><searchLink fieldCode="DE" term="%22Digital+signatures%22">Digital signatures</searchLink><br /><searchLink fieldCode="DE" term="%22Euclidean+distance%22">Euclidean distance</searchLink><br /><searchLink fieldCode="DE" term="%22Elliptic+curve+cryptography%22">Elliptic curve cryptography</searchLink><br /><searchLink fieldCode="DE" term="%22Fault+tolerance+%28Engineering%29%22">Fault tolerance (Engineering)</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: The extended Euclidean algorithm (EEA) is an important scheme for performing the division operation in finite fields. Many sensitive and security-constrained applications such as those using the elliptic curve cryptography for establishing key agreement schemes, augmented encryption approaches, and digital signature algorithms utilize this operation in their structures. Although much study is performed to realize the EEA in hardware efficiently, research on its reliable implementations needs to be done to achieve fault-immune reliable structures. In this regard, this paper presents a new concurrent error detection (CED) scheme to provide reliability for the aforementioned sensitive and constrained applications. Our proposed CED architecture is a step forward toward more reliable architectures for the EEA algorithm architectures. Through simulations and based on the number of parity bits used, the error detection capability of our CED architecture is derived to be 100% for single-bit errors and close to 99% for the experimented multiple-bit errors. In addition, we present the performance degradations of the proposed approach, leading to low-cost and reliable EEA architectures. The proposed reliable architectures are also suitable for constrained and fault-sensitive embedded applications utilizing the EEA hardware implementations. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of IEEE Transactions on Very Large Scale Integration (VLSI) Systems is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/TVLSI.2013.2260570 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 9 StartPage: 995 Subjects: – SubjectFull: Data encryption Type: general – SubjectFull: Concurrent error detection Type: general – SubjectFull: Algorithms Type: general – SubjectFull: Digital signatures Type: general – SubjectFull: Euclidean distance Type: general – SubjectFull: Elliptic curve cryptography Type: general – SubjectFull: Fault tolerance (Engineering) Type: general Titles: – TitleFull: Reliable Concurrent Error Detection Architectures for Extended Euclidean-Based Division Over GF(2^m). Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Mozaffari-Kermani, Mehran – PersonEntity: Name: NameFull: Azarderakhsh, Reza – PersonEntity: Name: NameFull: Lee, Chiou-Yng – PersonEntity: Name: NameFull: Bayat-Sarmadi, Siavash IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 05 Text: May2014 Type: published Y: 2014 Identifiers: – Type: issn-print Value: 10638210 Numbering: – Type: volume Value: 22 – Type: issue Value: 5 Titles: – TitleFull: IEEE Transactions on Very Large Scale Integration (VLSI) Systems Type: main |
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