APA (7th ed.) Citation

Reichenbach, M., Seidler, R., Pfundt, B., & Fey, D. (2014). Fast image processing for optical metrology utilizing heterogeneous computer architectures. Computers & Electrical Engineering, 40(4), 1158. https://doi.org/10.1016/j.compeleceng.2013.09.008

Chicago Style (17th ed.) Citation

Reichenbach, Marc, Ralf Seidler, Benjamin Pfundt, and Dietmar Fey. "Fast Image Processing for Optical Metrology Utilizing Heterogeneous Computer Architectures." Computers & Electrical Engineering 40, no. 4 (2014): 1158. https://doi.org/10.1016/j.compeleceng.2013.09.008.

MLA (9th ed.) Citation

Reichenbach, Marc, et al. "Fast Image Processing for Optical Metrology Utilizing Heterogeneous Computer Architectures." Computers & Electrical Engineering, vol. 40, no. 4, 2014, p. 1158, https://doi.org/10.1016/j.compeleceng.2013.09.008.