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Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale.

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Title: Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale.
Authors: Sebastiani, M.1 marco.sebastiani@uniroma3.it, Eberl, C.2,3, Bemporad, E.1, Korsunsky, A.M.4, Nix, W.D.5, Carassiti, F.1
Source: Surface & Coatings Technology. Jul2014, Vol. 251, p151-161. 11p.
Subjects: Focused ion beams, Milling (Metalwork), Residual stresses, Digital image correlation, Thin films, Nanostructured materials
Abstract: Abstract: A novel method is presented for the assessment of the Poisson's ratio and residual stress on the micron scale, based on focused ion beam (FIB) two-step four-slot micro-milling and in-situ digital image correlation (DIC) analysis of the induced relaxation strains at the specimen's surface. The methodology has been fully validated through modelling and experiments on three different materials, namely, physical vapour deposition (PVD) chromium nitride (CrN), and as-deposited and annealed Cu thin films. The cases of non-equibiaxial stress state and non-isotropic elastic behaviour are discussed in detail, and a quantitative evaluation of the accuracy, error sensitivity and the effects of microstructure and anisotropy is presented. This method represents a substantial improvement over the existing state-of-the-art. It is suitable for application on amorphous and nanostructured materials, and provides a breakthrough in micro-scale Poisson's ratio analysis of thin films and small structures and components. [Copyright &y& Elsevier]
Copyright of Surface & Coatings Technology is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
FullText Text:
  Availability: 0
Header DbId: egs
DbLabel: Engineering Source
An: 96242009
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Sebastiani%2C+M%2E%22">Sebastiani, M.</searchLink><relatesTo>1</relatesTo><i> marco.sebastiani@uniroma3.it</i><br /><searchLink fieldCode="AR" term="%22Eberl%2C+C%2E%22">Eberl, C.</searchLink><relatesTo>2,3</relatesTo><br /><searchLink fieldCode="AR" term="%22Bemporad%2C+E%2E%22">Bemporad, E.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Korsunsky%2C+A%2EM%2E%22">Korsunsky, A.M.</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AR" term="%22Nix%2C+W%2ED%2E%22">Nix, W.D.</searchLink><relatesTo>5</relatesTo><br /><searchLink fieldCode="AR" term="%22Carassiti%2C+F%2E%22">Carassiti, F.</searchLink><relatesTo>1</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Surface+%26+Coatings+Technology%22">Surface & Coatings Technology</searchLink>. Jul2014, Vol. 251, p151-161. 11p.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Focused+ion+beams%22">Focused ion beams</searchLink><br /><searchLink fieldCode="DE" term="%22Milling+%28Metalwork%29%22">Milling (Metalwork)</searchLink><br /><searchLink fieldCode="DE" term="%22Residual+stresses%22">Residual stresses</searchLink><br /><searchLink fieldCode="DE" term="%22Digital+image+correlation%22">Digital image correlation</searchLink><br /><searchLink fieldCode="DE" term="%22Thin+films%22">Thin films</searchLink><br /><searchLink fieldCode="DE" term="%22Nanostructured+materials%22">Nanostructured materials</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: Abstract: A novel method is presented for the assessment of the Poisson's ratio and residual stress on the micron scale, based on focused ion beam (FIB) two-step four-slot micro-milling and in-situ digital image correlation (DIC) analysis of the induced relaxation strains at the specimen's surface. The methodology has been fully validated through modelling and experiments on three different materials, namely, physical vapour deposition (PVD) chromium nitride (CrN), and as-deposited and annealed Cu thin films. The cases of non-equibiaxial stress state and non-isotropic elastic behaviour are discussed in detail, and a quantitative evaluation of the accuracy, error sensitivity and the effects of microstructure and anisotropy is presented. This method represents a substantial improvement over the existing state-of-the-art. It is suitable for application on amorphous and nanostructured materials, and provides a breakthrough in micro-scale Poisson's ratio analysis of thin films and small structures and components. [Copyright &y& Elsevier]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Surface & Coatings Technology is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1016/j.surfcoat.2014.04.019
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 11
        StartPage: 151
    Subjects:
      – SubjectFull: Focused ion beams
        Type: general
      – SubjectFull: Milling (Metalwork)
        Type: general
      – SubjectFull: Residual stresses
        Type: general
      – SubjectFull: Digital image correlation
        Type: general
      – SubjectFull: Thin films
        Type: general
      – SubjectFull: Nanostructured materials
        Type: general
    Titles:
      – TitleFull: Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Sebastiani, M.
      – PersonEntity:
          Name:
            NameFull: Eberl, C.
      – PersonEntity:
          Name:
            NameFull: Bemporad, E.
      – PersonEntity:
          Name:
            NameFull: Korsunsky, A.M.
      – PersonEntity:
          Name:
            NameFull: Nix, W.D.
      – PersonEntity:
          Name:
            NameFull: Carassiti, F.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 25
              M: 07
              Text: Jul2014
              Type: published
              Y: 2014
          Identifiers:
            – Type: issn-print
              Value: 02578972
          Numbering:
            – Type: volume
              Value: 251
          Titles:
            – TitleFull: Surface & Coatings Technology
              Type: main
ResultId 1