Ueta, G., Wada, J., Okabe, S., Miyashita, M., Nishida, C., & Kamei, M. (2014). Insulation characteristics of epoxy insulator with internal crack-shaped micro-defects - study on the equivalence of accelerated degradation by frequency acceleration test. IEEE Transactions on Dielectrics & Electrical Insulation, 21(3), 1216. https://doi.org/10.1109/TDEI.2014.6832268
Chicago Style (17th ed.) CitationUeta, Genyo, Junichi Wada, Shigemitsu Okabe, Makoto Miyashita, Chieko Nishida, and Mitsuhito Kamei. "Insulation Characteristics of Epoxy Insulator with Internal Crack-shaped Micro-defects - Study on the Equivalence of Accelerated Degradation by Frequency Acceleration Test." IEEE Transactions on Dielectrics & Electrical Insulation 21, no. 3 (2014): 1216. https://doi.org/10.1109/TDEI.2014.6832268.
MLA (9th ed.) CitationUeta, Genyo, et al. "Insulation Characteristics of Epoxy Insulator with Internal Crack-shaped Micro-defects - Study on the Equivalence of Accelerated Degradation by Frequency Acceleration Test." IEEE Transactions on Dielectrics & Electrical Insulation, vol. 21, no. 3, 2014, p. 1216, https://doi.org/10.1109/TDEI.2014.6832268.