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Electrical aging of extruded dielectric cables.

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Bibliographic Details
Title: Electrical aging of extruded dielectric cables.
Authors: Parpal, Jean-Luc, Crine, Jean-Pierre
Source: IEEE Transactions on Dielectrics & Electrical Insulation. Apr97, Vol. 4 Issue 2, p197. 13p. 1 Diagram, 7 Charts, 13 Graphs.
Subjects: Electricity experiments
Abstract: Part I. Proposes a model to describe all experimental results on electrical aging of cables. Discussion on predictions made by the model; Experiments done; Results of the experiments.
Database: Engineering Source
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  Availability: 0
Header DbId: egs
DbLabel: Engineering Source
An: 9707086781
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Electrical aging of extruded dielectric cables.
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  Data: <searchLink fieldCode="AR" term="%22Parpal%2C+Jean-Luc%22">Parpal, Jean-Luc</searchLink><br /><searchLink fieldCode="AR" term="%22Crine%2C+Jean-Pierre%22">Crine, Jean-Pierre</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Dielectrics+%26+Electrical+Insulation%22">IEEE Transactions on Dielectrics & Electrical Insulation</searchLink>. Apr97, Vol. 4 Issue 2, p197. 13p. 1 Diagram, 7 Charts, 13 Graphs.
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  Data: Part I. Proposes a model to describe all experimental results on electrical aging of cables. Discussion on predictions made by the model; Experiments done; Results of the experiments.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=9707086781
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/94.595247
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      – Code: eng
        Text: English
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        PageCount: 13
        StartPage: 197
    Subjects:
      – SubjectFull: Electricity experiments
        Type: general
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      – TitleFull: Electrical aging of extruded dielectric cables.
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            NameFull: Parpal, Jean-Luc
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            NameFull: Crine, Jean-Pierre
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            – D: 01
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              Text: Apr97
              Type: published
              Y: 1997
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            – TitleFull: IEEE Transactions on Dielectrics & Electrical Insulation
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