A new approach to deal with non-linearities in Si detector response

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Title: A new approach to deal with non-linearities in Si detector response
Authors: Menchaca-Rocha, A. amen@servidor.unam.mx, Cabrera, J.I.1, Alfaro, R.1, Belmont-Moreno, E.1, Martínez-Dávalos, A.1
Source: Nuclear Instruments & Methods in Physics Research Section B. Jul2003, Vol. 207 Issue 3, p356. 12p.
Subjects: Solid state electronics, Cosmic rays
Abstract: A model is proposed to understand the non-linear response of Si detectors to high Z particles, which are responsible for the pulse height defect (PHD). In this phenomenon, inefficient charge collection due to charge carrier recombination is related to high energy density regions in the vicinity of the particle track, while contributions from non-ionizing atomic collisions are also estimated from the radial distribution of scattered lattice ions. These model calculations successfully reproduce published PHD data, while predicting unexpected effects in silicon-based semiconductor detection of high (relativistic) energy heavy ions. This is used to explain what seemed as intriguing features of silicon-tracker data from the Alpha Magnetic Spectrometer space project. The present model is proposed to obtain reliable ion energy measurements using silicon detectors. [Copyright &y& Elsevier]
Copyright of Nuclear Instruments & Methods in Physics Research Section B is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: A new approach to deal with non-linearities in Si detector response
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  Data: <searchLink fieldCode="AR" term="%22Menchaca-Rocha%2C+A%2E%22">Menchaca-Rocha, A.</searchLink><i> amen@servidor.unam.mx</i><br /><searchLink fieldCode="AR" term="%22Cabrera%2C+J%2EI%2E%22">Cabrera, J.I.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Alfaro%2C+R%2E%22">Alfaro, R.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Belmont-Moreno%2C+E%2E%22">Belmont-Moreno, E.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Martínez-Dávalos%2C+A%2E%22">Martínez-Dávalos, A.</searchLink><relatesTo>1</relatesTo>
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  Data: <searchLink fieldCode="DE" term="%22Solid+state+electronics%22">Solid state electronics</searchLink><br /><searchLink fieldCode="DE" term="%22Cosmic+rays%22">Cosmic rays</searchLink>
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  Data: A model is proposed to understand the non-linear response of Si detectors to high <f>Z</f> particles, which are responsible for the pulse height defect (PHD). In this phenomenon, inefficient charge collection due to charge carrier recombination is related to high energy density regions in the vicinity of the particle track, while contributions from non-ionizing atomic collisions are also estimated from the radial distribution of scattered lattice ions. These model calculations successfully reproduce published PHD data, while predicting unexpected effects in silicon-based semiconductor detection of high (relativistic) energy heavy ions. This is used to explain what seemed as intriguing features of silicon-tracker data from the Alpha Magnetic Spectrometer space project. The present model is proposed to obtain reliable ion energy measurements using silicon detectors. [Copyright &y& Elsevier]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Nuclear Instruments & Methods in Physics Research Section B is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1016/S0168-583X(03)00674-8
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              Text: Jul2003
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