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An Alternating-Current Voltage Modulated Thermal Probe Technique for Local Seebeck Coefficient Characterization.

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Title: An Alternating-Current Voltage Modulated Thermal Probe Technique for Local Seebeck Coefficient Characterization.
Authors: Xu Kun-Qi1,2, Zeng Hua-Rong1 huarongzeng@mail.sic.ac.cn, Yu Hui-Zhu1,2, Zhao Kun-Yu1, Li Guo-Rong1, Song Jun-Qiang3, Shi Xun3, Chen Li-Dong3
Source: Chinese Physics Letters. Dec2014, Vol. 31 Issue 12, p1-1. 1p.
Subjects: Alternating currents, Electric potential, Thermal analysis, Seebeck coefficient, Atomic force microscopes, Thermoelectric effects
Abstract: An ac voltage-modulated thermal probe technique based on the atomic force microscope is developed to measure local Seebeck coefficients (S) of thermoelectric bulk and films. The characterization principle is based on the strictly quadratic relationship between the excited local dc Seebeck voltage and the applied ac voltage at high frequency. Excellent agreement is found between local S values and their corresponding macro-S values of thermoelectric bulk and thin films. This thermoelectric probe technique provides a very convenient, promising tool for local thermoelectric parameters with sub-micrometer scale resolution. [ABSTRACT FROM AUTHOR]
Copyright of Chinese Physics Letters is the property of IOP Publishing and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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DbLabel: Engineering Source
An: 99823156
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: An Alternating-Current Voltage Modulated Thermal Probe Technique for Local Seebeck Coefficient Characterization.
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  Data: <searchLink fieldCode="JN" term="%22Chinese+Physics+Letters%22">Chinese Physics Letters</searchLink>. Dec2014, Vol. 31 Issue 12, p1-1. 1p.
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  Data: An ac voltage-modulated thermal probe technique based on the atomic force microscope is developed to measure local Seebeck coefficients (S) of thermoelectric bulk and films. The characterization principle is based on the strictly quadratic relationship between the excited local dc Seebeck voltage and the applied ac voltage at high frequency. Excellent agreement is found between local S values and their corresponding macro-S values of thermoelectric bulk and thin films. This thermoelectric probe technique provides a very convenient, promising tool for local thermoelectric parameters with sub-micrometer scale resolution. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
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  Data: <i>Copyright of Chinese Physics Letters is the property of IOP Publishing and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1088/0256-307X/31/12/127201
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        Text: English
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        Type: general
      – SubjectFull: Thermal analysis
        Type: general
      – SubjectFull: Seebeck coefficient
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      – SubjectFull: Atomic force microscopes
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              Text: Dec2014
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