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Using Multiple Maximum Exposure Rates in Computerized Adaptive Testing.

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Title: Using Multiple Maximum Exposure Rates in Computerized Adaptive Testing.
Authors: Gorney, Kylie1 (AUTHOR) kgorney@msu.edu, Reckase, Mark D.1 (AUTHOR)
Source: Journal of Educational Measurement. Jun2025, Vol. 62 Issue 2, p360-379. 20p.
Subject Terms: *Computer adaptive testing
Abstract: In computerized adaptive testing, item exposure control methods are often used to provide a more balanced usage of the item pool. Many of the most popular methods, including the restricted method (Revuelta and Ponsoda), use a single maximum exposure rate to limit the proportion of times that each item is administered. However, Barrada et al. showed that by using multiple maximum exposure rates, it is possible to obtain an even more balanced usage of the item pool. Therefore, in this paper, we develop four extensions of the restricted method that involve the use of multiple maximum exposure rates. A detailed simulation study reveals that (a) all four of the new methods improve item pool utilization and (b) three of the new methods also improve measurement accuracy. Taken together, these results are highly encouraging, as they reveal that it is possible to improve both types of outcomes simultaneously. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Educational Measurement is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Education Research Complete
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  Data: Using Multiple Maximum Exposure Rates in Computerized Adaptive Testing.
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  Data: <searchLink fieldCode="AR" term="%22Gorney%2C+Kylie%22">Gorney, Kylie</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> kgorney@msu.edu</i><br /><searchLink fieldCode="AR" term="%22Reckase%2C+Mark+D%2E%22">Reckase, Mark D.</searchLink><relatesTo>1</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Educational+Measurement%22">Journal of Educational Measurement</searchLink>. Jun2025, Vol. 62 Issue 2, p360-379. 20p.
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  Data: In computerized adaptive testing, item exposure control methods are often used to provide a more balanced usage of the item pool. Many of the most popular methods, including the restricted method (Revuelta and Ponsoda), use a single maximum exposure rate to limit the proportion of times that each item is administered. However, Barrada et al. showed that by using multiple maximum exposure rates, it is possible to obtain an even more balanced usage of the item pool. Therefore, in this paper, we develop four extensions of the restricted method that involve the use of multiple maximum exposure rates. A detailed simulation study reveals that (a) all four of the new methods improve item pool utilization and (b) three of the new methods also improve measurement accuracy. Taken together, these results are highly encouraging, as they reveal that it is possible to improve both types of outcomes simultaneously. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Journal of Educational Measurement is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1111/jedm.12436
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        Text: English
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              Text: Jun2025
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              Y: 2025
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