Instructional Topics in Educational Measurement (ITEMS) Module: Using Automated Processes to Generate Test Items.

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Title: Instructional Topics in Educational Measurement (ITEMS) Module: Using Automated Processes to Generate Test Items.
Authors: Gierl, Mark J.1, Lai, Hollis1
Source: Educational Measurement: Issues & Practice. Fall2013, Vol. 32 Issue 3, p36-50. 15p. 1 Black and White Photograph, 3 Diagrams, 5 Charts.
Subject Terms: *Educational tests & measurements, *Algorithms, Scale items, Computer engineering, Mathematical models
Abstract: Changes to the design and development of our educational assessments are resulting in the unprecedented demand for a large and continuous supply of content-specific test items. One way to address this growing demand is with automatic item generation (AIG). AIG is the process of using item models to generate test items with the aid of computer technology. The purpose of this module is to describe and illustrate a template-based method for generating test items. We outline a three-step approach where test development specialists first create an item model. An item model is like a mould or rendering that highlights the features in an assessment task that must be manipulated to produce new items. Next, the content used for item generation is identified and structured. Finally, features in the item model are systematically manipulated with computer-based algorithms to generate new items. Using this template-based approach, hundreds or even thousands of new items can be generated with a single item model. [ABSTRACT FROM AUTHOR]
Copyright of Educational Measurement: Issues & Practice is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: <searchLink fieldCode="JN" term="%22Educational+Measurement%3A+Issues+%26+Practice%22">Educational Measurement: Issues & Practice</searchLink>. Fall2013, Vol. 32 Issue 3, p36-50. 15p. 1 Black and White Photograph, 3 Diagrams, 5 Charts.
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  Data: Changes to the design and development of our educational assessments are resulting in the unprecedented demand for a large and continuous supply of content-specific test items. One way to address this growing demand is with automatic item generation (AIG). AIG is the process of using item models to generate test items with the aid of computer technology. The purpose of this module is to describe and illustrate a template-based method for generating test items. We outline a three-step approach where test development specialists first create an item model. An item model is like a mould or rendering that highlights the features in an assessment task that must be manipulated to produce new items. Next, the content used for item generation is identified and structured. Finally, features in the item model are systematically manipulated with computer-based algorithms to generate new items. Using this template-based approach, hundreds or even thousands of new items can be generated with a single item model. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of Educational Measurement: Issues & Practice is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1111/emip.12018
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              Text: Fall2013
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