Single-Event Upset in Evolving Commercial Silicon-on-Insulator Microprocessor Technologies.
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| Title: | Single-Event Upset in Evolving Commercial Silicon-on-Insulator Microprocessor Technologies. |
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| Authors: | Irom, F.1 farokh.irom@jpl.nasa.gov, Farmanesh, F. H.1, Swift, G. M.1, Johnston, A. H.1, Yoder, G. L.2 geoffrey.1.yoder@nasa.gov |
| Source: | IEEE Transactions on Nuclear Science. Dec2003 Part 1 of 2, Vol. 50 Issue 6, p2107-2112. 6p. |
| Database: | Environment Complete |
| ISSN: | 00189499 |
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| DOI: | 10.1109/TNS.2003.821820 |
