View in EDS

Single-Event Upset in Evolving Commercial Silicon-on-Insulator Microprocessor Technologies.

Saved in:
Bibliographic Details
Title: Single-Event Upset in Evolving Commercial Silicon-on-Insulator Microprocessor Technologies.
Authors: Irom, F.1 farokh.irom@jpl.nasa.gov, Farmanesh, F. H.1, Swift, G. M.1, Johnston, A. H.1, Yoder, G. L.2 geoffrey.1.yoder@nasa.gov
Source: IEEE Transactions on Nuclear Science. Dec2003 Part 1 of 2, Vol. 50 Issue 6, p2107-2112. 6p.
Database: Environment Complete
FullText Text:
  Availability: 0
Header DbId: eih
DbLabel: Environment Complete
An: 12517456
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Single-Event Upset in Evolving Commercial Silicon-on-Insulator Microprocessor Technologies.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Irom%2C+F%2E%22">Irom, F.</searchLink><relatesTo>1</relatesTo><i> farokh.irom@jpl.nasa.gov</i><br /><searchLink fieldCode="AR" term="%22Farmanesh%2C+F%2E+H%2E%22">Farmanesh, F. H.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Swift%2C+G%2E+M%2E%22">Swift, G. M.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Johnston%2C+A%2E+H%2E%22">Johnston, A. H.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Yoder%2C+G%2E+L%2E%22">Yoder, G. L.</searchLink><relatesTo>2</relatesTo><i> geoffrey.1.yoder@nasa.gov</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Nuclear+Science%22">IEEE Transactions on Nuclear Science</searchLink>. Dec2003 Part 1 of 2, Vol. 50 Issue 6, p2107-2112. 6p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=eih&AN=12517456
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/TNS.2003.821820
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 6
        StartPage: 2107
    Titles:
      – TitleFull: Single-Event Upset in Evolving Commercial Silicon-on-Insulator Microprocessor Technologies.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Irom, F.
      – PersonEntity:
          Name:
            NameFull: Farmanesh, F. H.
      – PersonEntity:
          Name:
            NameFull: Swift, G. M.
      – PersonEntity:
          Name:
            NameFull: Johnston, A. H.
      – PersonEntity:
          Name:
            NameFull: Yoder, G. L.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 12
              Text: Dec2003 Part 1 of 2
              Type: published
              Y: 2003
          Identifiers:
            – Type: issn-print
              Value: 00189499
          Numbering:
            – Type: volume
              Value: 50
            – Type: issue
              Value: 6
          Titles:
            – TitleFull: IEEE Transactions on Nuclear Science
              Type: main
ResultId 1