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Focused Ion Beam Scanning Electron Microscopy in Soil Science: New Approaches to Soil Structure Analysis.

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Title: Focused Ion Beam Scanning Electron Microscopy in Soil Science: New Approaches to Soil Structure Analysis.
Authors: Tolstygin, K. D.1,2 (AUTHOR) kirill.tolstygin@yandex.ru, Romanenko, K. A.2 (AUTHOR) romanenko_ka@esoil.ru, Korostylev, E. V.3 (AUTHOR) korostylev.ev@mipt.ru, Parochkin, A. V.3 (AUTHOR) parochkin.av@mipt.ru, Skvortsova, E. B.2 (AUTHOR) eskvora@mail.ru, Gerke, K. M.3,4 (AUTHOR) gerke.km@mipt.ru
Source: Moscow University Soil Science Bulletin. Mar2026, Vol. 81 Issue 1, p123-132. 10p.
Database: Environment Complete
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Header DbId: eih
DbLabel: Environment Complete
An: 192768544
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Focused Ion Beam Scanning Electron Microscopy in Soil Science: New Approaches to Soil Structure Analysis.
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  Data: <searchLink fieldCode="JN" term="%22Moscow+University+Soil+Science+Bulletin%22">Moscow University Soil Science Bulletin</searchLink>. Mar2026, Vol. 81 Issue 1, p123-132. 10p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=eih&AN=192768544
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        Value: 10.3103/S0147687425700802
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        Text: English
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      – TitleFull: Focused Ion Beam Scanning Electron Microscopy in Soil Science: New Approaches to Soil Structure Analysis.
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              Text: Mar2026
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              Y: 2026
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