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What Technical Choices Matter to Characterize Heat Wave and Cold Snap Events in Support of Bulk Power Grid Reliability Studies?

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Title: What Technical Choices Matter to Characterize Heat Wave and Cold Snap Events in Support of Bulk Power Grid Reliability Studies?
Authors: Wan, Heng1 (AUTHOR) heng.wan@pnnl.gov, Burleyson, Casey D.1 (AUTHOR), Voisin, Nathalie1,2 (AUTHOR) nathalie.voisin@pnnl.gov
Source: Earth's Future. Jun2026, Vol. 14 Issue 6, p1-17. 17p.
Database: Environment Complete
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Header DbId: eih
DbLabel: Environment Complete
An: 194917370
AccessLevel: 2
PubType: Academic Journal
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  Data: What Technical Choices Matter to Characterize Heat Wave and Cold Snap Events in Support of Bulk Power Grid Reliability Studies?
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  Data: <searchLink fieldCode="AR" term="%22Wan%2C+Heng%22">Wan, Heng</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> heng.wan@pnnl.gov</i><br /><searchLink fieldCode="AR" term="%22Burleyson%2C+Casey+D%2E%22">Burleyson, Casey D.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Voisin%2C+Nathalie%22">Voisin, Nathalie</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> nathalie.voisin@pnnl.gov</i>
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  Data: <searchLink fieldCode="JN" term="%22Earth's+Future%22">Earth's Future</searchLink>. Jun2026, Vol. 14 Issue 6, p1-17. 17p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=eih&AN=194917370
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      – Type: doi
        Value: 10.1029/2025EF006623
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      – Code: eng
        Text: English
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        PageCount: 17
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      – TitleFull: What Technical Choices Matter to Characterize Heat Wave and Cold Snap Events in Support of Bulk Power Grid Reliability Studies?
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            NameFull: Wan, Heng
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            NameFull: Burleyson, Casey D.
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              Text: Jun2026
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              Y: 2026
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