APA (7th ed.) Citation

van Niekerk, D., & Venter, J. (2026). A Low-Cost Method for Trip Current Reliability Analysis of Polymer Positive Temperature Coefficient Resettable Fuses. Energies (19961073), 19(11), 2576. https://doi.org/10.3390/en19112576

Chicago Style (17th ed.) Citation

van Niekerk, Daniel, and Johan Venter. "A Low-Cost Method for Trip Current Reliability Analysis of Polymer Positive Temperature Coefficient Resettable Fuses." Energies (19961073) 19, no. 11 (2026): 2576. https://doi.org/10.3390/en19112576.

MLA (9th ed.) Citation

van Niekerk, Daniel, and Johan Venter. "A Low-Cost Method for Trip Current Reliability Analysis of Polymer Positive Temperature Coefficient Resettable Fuses." Energies (19961073), vol. 19, no. 11, 2026, p. 2576, https://doi.org/10.3390/en19112576.