Finding Words Associated with DIF: Predicting Differential Item Functioning Using LLMs and Explainable AI
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| Title: | Finding Words Associated with DIF: Predicting Differential Item Functioning Using LLMs and Explainable AI |
|---|---|
| Language: | English |
| Authors: | Hotaka Maeda (ORCID |
| Source: | Journal of Educational Measurement. 2025 62(4):883-906. |
| Availability: | Wiley. Available from: John Wiley & Sons, Inc. 111 River Street, Hoboken, NJ 07030. Tel: 800-835-6770; e-mail: cs-journals@wiley.com; Web site: https://www.wiley.com/en-us |
| Peer Reviewed: | Y |
| Page Count: | 24 |
| Publication Date: | 2025 |
| Document Type: | Journal Articles Reports - Research |
| Education Level: | Elementary Secondary Education |
| Descriptors: | Artificial Intelligence, Prediction, Test Bias, Test Items, Vocabulary, Language Arts, Mathematics, Summative Evaluation, Elementary Secondary Education, Test Content |
| DOI: | 10.1111/jedm.70017 |
| ISSN: | 0022-0655 1745-3984 |
| Abstract: | We fine-tuned and compared several encoder-based Transformer large language models (LLM) to predict differential item functioning (DIF) from the item text. We then applied explainable artificial intelligence (XAI) methods to identify specific words associated with the DIF prediction. The data included 42,180 items designed for English language arts and mathematics summative state assessments among students in grades 3 to 11. Prediction R[superscript 2] ranged from 0.04 to 0.32 among eight focal and reference group pairs. Our findings suggest that many words associated with DIF reflect minor subdomains included in the test blueprint by design, rather than construct-irrelevant content that may need to be removed from assessments. This may explain why qualitative reviews of DIF items often yield inconclusive results. Our approach can be used to (1) screen words associated with DIF during the item-writing process for immediate revision to reduce preventable adverse DIF, (2) assist traditional DIF item reviews by highlighting key words, or (3) use DIF prediction as an alternative when obtaining sufficient sample size for traditional DIF analyses is impossible. Extensions of this research can enhance the assessment fairness, especially programs that lack resources to build high-quality items, and among smaller subpopulations with insufficient sample sizes for traditional DIF analyses. |
| Abstractor: | As Provided |
| Entry Date: | 2026 |
| Accession Number: | EJ1491342 |
| Database: | ERIC |
| FullText | Text: Availability: 0 |
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| Header | DbId: eric DbLabel: ERIC An: EJ1491342 AccessLevel: 3 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Finding Words Associated with DIF: Predicting Differential Item Functioning Using LLMs and Explainable AI – Name: Language Label: Language Group: Lang Data: English – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Hotaka+Maeda%22">Hotaka Maeda</searchLink> (ORCID <externalLink term="https://orcid.org/0009-0000-9498-786X">0009-0000-9498-786X</externalLink>)<br /><searchLink fieldCode="AR" term="%22Yikai+Lu%22">Yikai Lu</searchLink> (ORCID <externalLink term="https://orcid.org/0000-0003-4410-2589">0000-0003-4410-2589</externalLink>) – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="SO" term="%22Journal+of+Educational+Measurement%22"><i>Journal of Educational Measurement</i></searchLink>. 2025 62(4):883-906. – Name: Avail Label: Availability Group: Avail Data: Wiley. Available from: John Wiley & Sons, Inc. 111 River Street, Hoboken, NJ 07030. Tel: 800-835-6770; e-mail: cs-journals@wiley.com; Web site: https://www.wiley.com/en-us – Name: PeerReviewed Label: Peer Reviewed Group: SrcInfo Data: Y – Name: Pages Label: Page Count Group: Src Data: 24 – Name: DatePubCY Label: Publication Date Group: Date Data: 2025 – Name: TypeDocument Label: Document Type Group: TypDoc Data: Journal Articles<br />Reports - Research – Name: Audience Label: Education Level Group: Audnce Data: <searchLink fieldCode="EL" term="%22Elementary+Secondary+Education%22">Elementary Secondary Education</searchLink> – Name: Subject Label: Descriptors Group: Su Data: <searchLink fieldCode="DE" term="%22Artificial+Intelligence%22">Artificial Intelligence</searchLink><br /><searchLink fieldCode="DE" term="%22Prediction%22">Prediction</searchLink><br /><searchLink fieldCode="DE" term="%22Test+Bias%22">Test Bias</searchLink><br /><searchLink fieldCode="DE" term="%22Test+Items%22">Test Items</searchLink><br /><searchLink fieldCode="DE" term="%22Vocabulary%22">Vocabulary</searchLink><br /><searchLink fieldCode="DE" term="%22Language+Arts%22">Language Arts</searchLink><br /><searchLink fieldCode="DE" term="%22Mathematics%22">Mathematics</searchLink><br /><searchLink fieldCode="DE" term="%22Summative+Evaluation%22">Summative Evaluation</searchLink><br /><searchLink fieldCode="DE" term="%22Elementary+Secondary+Education%22">Elementary Secondary Education</searchLink><br /><searchLink fieldCode="DE" term="%22Test+Content%22">Test Content</searchLink> – Name: DOI Label: DOI Group: ID Data: 10.1111/jedm.70017 – Name: ISSN Label: ISSN Group: ISSN Data: 0022-0655<br />1745-3984 – Name: Abstract Label: Abstract Group: Ab Data: We fine-tuned and compared several encoder-based Transformer large language models (LLM) to predict differential item functioning (DIF) from the item text. We then applied explainable artificial intelligence (XAI) methods to identify specific words associated with the DIF prediction. The data included 42,180 items designed for English language arts and mathematics summative state assessments among students in grades 3 to 11. Prediction R[superscript 2] ranged from 0.04 to 0.32 among eight focal and reference group pairs. Our findings suggest that many words associated with DIF reflect minor subdomains included in the test blueprint by design, rather than construct-irrelevant content that may need to be removed from assessments. This may explain why qualitative reviews of DIF items often yield inconclusive results. Our approach can be used to (1) screen words associated with DIF during the item-writing process for immediate revision to reduce preventable adverse DIF, (2) assist traditional DIF item reviews by highlighting key words, or (3) use DIF prediction as an alternative when obtaining sufficient sample size for traditional DIF analyses is impossible. Extensions of this research can enhance the assessment fairness, especially programs that lack resources to build high-quality items, and among smaller subpopulations with insufficient sample sizes for traditional DIF analyses. – Name: AbstractInfo Label: Abstractor Group: Ab Data: As Provided – Name: DateEntry Label: Entry Date Group: Date Data: 2026 – Name: AN Label: Accession Number Group: ID Data: EJ1491342 |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=eric&AN=EJ1491342 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1111/jedm.70017 Languages: – Text: English PhysicalDescription: Pagination: PageCount: 24 StartPage: 883 Subjects: – SubjectFull: Artificial Intelligence Type: general – SubjectFull: Prediction Type: general – SubjectFull: Test Bias Type: general – SubjectFull: Test Items Type: general – SubjectFull: Vocabulary Type: general – SubjectFull: Language Arts Type: general – SubjectFull: Mathematics Type: general – SubjectFull: Summative Evaluation Type: general – SubjectFull: Elementary Secondary Education Type: general – SubjectFull: Test Content Type: general Titles: – TitleFull: Finding Words Associated with DIF: Predicting Differential Item Functioning Using LLMs and Explainable AI Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Hotaka Maeda – PersonEntity: Name: NameFull: Yikai Lu IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 12 Type: published Y: 2025 Identifiers: – Type: issn-print Value: 0022-0655 – Type: issn-electronic Value: 1745-3984 Numbering: – Type: volume Value: 62 – Type: issue Value: 4 Titles: – TitleFull: Journal of Educational Measurement Type: main |
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