Lee, W., Kim, S. Y., & Shin, S. (2026). Generalizability Theory for Randomly Parallel Testing. Journal of Educational Measurement, 63(1), . https://doi.org/10.1111/jedm.70029
Chicago Style (17th ed.) CitationLee, Won-Chan, Stella Y. Kim, and Seungwon Shin. "Generalizability Theory for Randomly Parallel Testing." Journal of Educational Measurement 63, no. 1 (2026). https://doi.org/10.1111/jedm.70029.
MLA (9th ed.) CitationLee, Won-Chan, et al. "Generalizability Theory for Randomly Parallel Testing." Journal of Educational Measurement, vol. 63, no. 1, 2026, https://doi.org/10.1111/jedm.70029.
Warning: These citations may not always be 100% accurate.