Generalizability Theory for Randomly Parallel Testing
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| Title: | Generalizability Theory for Randomly Parallel Testing |
|---|---|
| Language: | English |
| Authors: | Won-Chan Lee, Stella Y. Kim, Seungwon Shin |
| Source: | Journal of Educational Measurement. 2026 63(1). |
| Availability: | Wiley. Available from: John Wiley & Sons, Inc. 111 River Street, Hoboken, NJ 07030. Tel: 800-835-6770; e-mail: cs-journals@wiley.com; Web site: https://www.wiley.com/en-us |
| Peer Reviewed: | Y |
| Page Count: | 21 |
| Publication Date: | 2026 |
| Document Type: | Journal Articles Reports - Research |
| Descriptors: | Generalizability Theory, Artificial Intelligence, Error of Measurement, Test Reliability, Educational Testing |
| DOI: | 10.1111/jedm.70029 |
| ISSN: | 0022-0655 1745-3984 |
| Abstract: | Advancements in artificial intelligence (AI) have brought significant changes to testing practices, including the emergence of randomly parallel testing (RPT), in which examinees receive different but psychometrically similar sets of items generated from templates or AI-based systems. This paper presents a generalizability theory (GT) framework for estimating conditional standard errors of measurement (CSEMs) and related reliability indices, with a particular focus on design structures commonly encountered in RPT within domain-referenced testing contexts. The proposed framework supports the evaluation of score precision across a variety of operational designs, including crossed, nested, and multivariate configurations. Several illustrative examples are provided to demonstrate the methodology in practical settings. The paper also addresses key psychometric and interpretive challenges associated with RPT and outlines promising directions for future research. |
| Abstractor: | As Provided |
| Entry Date: | 2026 |
| Accession Number: | EJ1501420 |
| Database: | ERIC |
| FullText | Text: Availability: 0 |
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| Header | DbId: eric DbLabel: ERIC An: EJ1501420 AccessLevel: 3 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=eric&AN=EJ1501420 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1111/jedm.70029 Languages: – Text: English PhysicalDescription: Pagination: PageCount: 21 Subjects: – SubjectFull: Generalizability Theory Type: general – SubjectFull: Artificial Intelligence Type: general – SubjectFull: Error of Measurement Type: general – SubjectFull: Test Reliability Type: general – SubjectFull: Educational Testing Type: general Titles: – TitleFull: Generalizability Theory for Randomly Parallel Testing Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Won-Chan Lee – PersonEntity: Name: NameFull: Stella Y. Kim – PersonEntity: Name: NameFull: Seungwon Shin IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 03 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 0022-0655 – Type: issn-electronic Value: 1745-3984 Numbering: – Type: volume Value: 63 – Type: issue Value: 1 Titles: – TitleFull: Journal of Educational Measurement Type: main |
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