Industry-Oriented Laboratory Development for Mixed-Signal IC Test Education
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| Title: | Industry-Oriented Laboratory Development for Mixed-Signal IC Test Education |
|---|---|
| Language: | English |
| Authors: | Hu, J., Haffner, M., Yoder, S., Scott, M., Reehal, G., Ismail, M. |
| Source: | IEEE Transactions on Education. Nov 2010 53(4):662-671. |
| Availability: | Institute of Electrical and Electronics Engineers, Inc. 445 Hoes Lane, Piscataway, NJ 08854. Tel: 732-981-0060; Web site: http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=13 |
| Peer Reviewed: | Y |
| Page Count: | 10 |
| Publication Date: | 2010 |
| Intended Audience: | Students; Teachers |
| Document Type: | Journal Articles Reports - Descriptive |
| Descriptors: | Feedback (Response), Course Objectives, Academic Achievement, Laboratories, Engineering, Electronic Equipment, Equipment, Computer Software, College Students, Surveys |
| Geographic Terms: | Ohio |
| DOI: | 10.1109/TE.2010.2040738 |
| ISSN: | 0018-9359 |
| Abstract: | The semiconductor industry is lacking qualified integrated circuit (IC) test engineers to serve in the field of mixed-signal electronics. The absence of mixed-signal IC test education at the collegiate level is cited as one of the main sources for this problem. In response to this situation, the Department of Electrical and Computer Engineering at the Ohio State University, Columbus, has partnered with Texas Instruments to establish an IC test-engineering-oriented course. The course objectives are to familiarize students with industrial testing techniques and to help students obtain the fundamental skill sets required to be competent mixed-signal IC test engineers. A novel laboratory pedagogy is developed to achieve these objectives. The results of the classroom assignments and the feedback provided by students, faculty, and industry representatives indicate that the approach has successfully achieved these goals. (Contains 8 figures and 8 tables.) |
| Abstractor: | As Provided |
| Number of References: | 26 |
| Entry Date: | 2010 |
| Accession Number: | EJ905551 |
| Database: | ERIC |
| FullText | Text: Availability: 0 |
|---|---|
| Header | DbId: eric DbLabel: ERIC An: EJ905551 AccessLevel: 3 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Industry-Oriented Laboratory Development for Mixed-Signal IC Test Education – Name: Language Label: Language Group: Lang Data: English – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Hu%2C+J%2E%22">Hu, J.</searchLink><br /><searchLink fieldCode="AR" term="%22Haffner%2C+M%2E%22">Haffner, M.</searchLink><br /><searchLink fieldCode="AR" term="%22Yoder%2C+S%2E%22">Yoder, S.</searchLink><br /><searchLink fieldCode="AR" term="%22Scott%2C+M%2E%22">Scott, M.</searchLink><br /><searchLink fieldCode="AR" term="%22Reehal%2C+G%2E%22">Reehal, G.</searchLink><br /><searchLink fieldCode="AR" term="%22Ismail%2C+M%2E%22">Ismail, M.</searchLink> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="SO" term="%22IEEE+Transactions+on+Education%22"><i>IEEE Transactions on Education</i></searchLink>. Nov 2010 53(4):662-671. – Name: Avail Label: Availability Group: Avail Data: Institute of Electrical and Electronics Engineers, Inc. 445 Hoes Lane, Piscataway, NJ 08854. Tel: 732-981-0060; Web site: http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=13 – Name: PeerReviewed Label: Peer Reviewed Group: SrcInfo Data: Y – Name: Pages Label: Page Count Group: Src Data: 10 – Name: DatePubCY Label: Publication Date Group: Date Data: 2010 – Name: Audience Label: Intended Audience Group: Audnce Data: Students; Teachers – Name: TypeDocument Label: Document Type Group: TypDoc Data: Journal Articles<br />Reports - Descriptive – Name: Subject Label: Descriptors Group: Su Data: <searchLink fieldCode="DE" term="%22Feedback+%28Response%29%22">Feedback (Response)</searchLink><br /><searchLink fieldCode="DE" term="%22Course+Objectives%22">Course Objectives</searchLink><br /><searchLink fieldCode="DE" term="%22Academic+Achievement%22">Academic Achievement</searchLink><br /><searchLink fieldCode="DE" term="%22Laboratories%22">Laboratories</searchLink><br /><searchLink fieldCode="DE" term="%22Engineering%22">Engineering</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+Equipment%22">Electronic Equipment</searchLink><br /><searchLink fieldCode="DE" term="%22Equipment%22">Equipment</searchLink><br /><searchLink fieldCode="DE" term="%22Computer+Software%22">Computer Software</searchLink><br /><searchLink fieldCode="DE" term="%22College+Students%22">College Students</searchLink><br /><searchLink fieldCode="DE" term="%22Surveys%22">Surveys</searchLink> – Name: Subject Label: Geographic Terms Group: Su Data: <searchLink fieldCode="DE" term="%22Ohio%22">Ohio</searchLink> – Name: DOI Label: DOI Group: ID Data: 10.1109/TE.2010.2040738 – Name: ISSN Label: ISSN Group: ISSN Data: 0018-9359 – Name: Abstract Label: Abstract Group: Ab Data: The semiconductor industry is lacking qualified integrated circuit (IC) test engineers to serve in the field of mixed-signal electronics. The absence of mixed-signal IC test education at the collegiate level is cited as one of the main sources for this problem. In response to this situation, the Department of Electrical and Computer Engineering at the Ohio State University, Columbus, has partnered with Texas Instruments to establish an IC test-engineering-oriented course. The course objectives are to familiarize students with industrial testing techniques and to help students obtain the fundamental skill sets required to be competent mixed-signal IC test engineers. A novel laboratory pedagogy is developed to achieve these objectives. The results of the classroom assignments and the feedback provided by students, faculty, and industry representatives indicate that the approach has successfully achieved these goals. (Contains 8 figures and 8 tables.) – Name: AbstractInfo Label: Abstractor Group: Ab Data: As Provided – Name: Ref Label: Number of References Group: RefInfo Data: 26 – Name: DateEntry Label: Entry Date Group: Date Data: 2010 – Name: AN Label: Accession Number Group: ID Data: EJ905551 |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=eric&AN=EJ905551 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/TE.2010.2040738 Languages: – Text: English PhysicalDescription: Pagination: PageCount: 10 StartPage: 662 Subjects: – SubjectFull: Feedback (Response) Type: general – SubjectFull: Course Objectives Type: general – SubjectFull: Academic Achievement Type: general – SubjectFull: Laboratories Type: general – SubjectFull: Engineering Type: general – SubjectFull: Electronic Equipment Type: general – SubjectFull: Equipment Type: general – SubjectFull: Computer Software Type: general – SubjectFull: College Students Type: general – SubjectFull: Surveys Type: general – SubjectFull: Ohio Type: general Titles: – TitleFull: Industry-Oriented Laboratory Development for Mixed-Signal IC Test Education Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Hu, J. – PersonEntity: Name: NameFull: Haffner, M. – PersonEntity: Name: NameFull: Yoder, S. – PersonEntity: Name: NameFull: Scott, M. – PersonEntity: Name: NameFull: Reehal, G. – PersonEntity: Name: NameFull: Ismail, M. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 11 Type: published Y: 2010 Identifiers: – Type: issn-print Value: 0018-9359 Numbering: – Type: volume Value: 53 – Type: issue Value: 4 Titles: – TitleFull: IEEE Transactions on Education Type: main |
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