| Authors: |
Airapetian A; Randall Laboratory of Physics, University of Michigan, Ann Arbor, MI 48109-1120, USA., Akopov N, Akopov Z, Amarian M, Andrus A, Aschenauer EC, Augustyniak W, Avakian R, Avetissian A, Avetissian E, Bacchetta A, Bailey P, Balin D, Beckmann M, Belostotski S, Bianchi N, Blok HP, Böttcher H, Borissov A, Borysenko A, Bouwhuis M, Brüll A, Bryzgalov V, Capitani GP, Cappiluppi M, Chen T, Ciullo G, Contalbrigo M, Dalpiaz PF, Leo RD, Demey M, Nardo LD, Sanctis ED, Devitsin E, Nezza PD, Düren M, Ehrenfried M, Elalaoui-Moulay A, Elbakian G, Ellinghaus F, Elschenbroich U, Fabbri R, Fantoni A, Fechtchenko A, Felawka L, Frullani S, Gapienko G, Gapienko V, Garibaldi F, Garrow K, Gavrilov G, Gharibyan V, Grebeniouk O, Gregor IM, Hadjidakis C, Hafidi K, Hartig M, Hasch D, Henoch M, Hesselink WH, Hillenbrand A, Hoek M, Holler Y, Hommez B, Hristova I, Iarygin G, Ilyichev A, Ivanilov A, Izotov A, Jackson HE, Jgoun A, Kaiser R, Kinney E, Kisselev A, Kobayashi T, Kopytin M, Korotkov V, Kozlov V, Krauss B, Krivokhijine VG, Lagamba L, Lapikás L, Laziev A, Lenisa P, Liebing P, Linden-Levy LA, Lorenzon W, Lu H, Lu J, Lu S, Ma BQ, Maiheu B, Makins NC, Mao Y, Marianski B, Marukyan H, Masoli F, Mexner V, Meyners N, Michler T, Mikloukho O, Miller CA, Miyachi Y, Muccifora V, Nagaitsev A, Nappi E, Naryshkin Y, Nass A, Negodaev M, Nowak WD, Oganessyan K, Ohsuga H, Osborne A, Pickert N, Potterveld DH, Raithel M, Reggiani D, Reimer PE, Reischl A, Reolon AR, Riedl C, Rith K, Rosner G, Rostomyan A, Rubacek L, Rubin J, Ryckbosch D, Salomatin Y, Sanjiev I, Savin I, Schäfer A, Schill C, Schnell G, Schüler KP, Seele J, Seidl R, Seitz B, Shanidze R, Shearer C, Shibata TA, Shutov V, Sinram K, Sommer W, Stancari M, Statera M, Steffens E, Steijger JJ, Stenzel H, Stewart J, Stinzing F, Tait P, Tanaka H, Taroian S, Tchuiko B, Terkulov A, Trzcinski A, Tytgat M, Vandenbroucke A, van der Nat PB, van der Steenhoven G, van Haarlem Y, Vetterli MC, Vikhrov V, Vincter MG, Vogel C, Volmer J, Wang S, Wendland J, Wilbert J, Smit GY, Ye Y, Ye Z, Yen S, Zihlmann B, Zupranski P |
