SW, M., & MR, P. (2006). Transient analysis of gaseous electron-ion recombination in the environmental scanning electron microscope. Journal of microscopy, 221(Pt 3), 183. https://doi.org/10.1111/j.1365-2818.2006.01554.x
Chicago Style (17th ed.) CitationSW, Morgan, and Phillips MR. "Transient Analysis of Gaseous Electron-ion Recombination in the Environmental Scanning Electron Microscope." Journal of Microscopy 221, no. Pt 3 (2006): 183. https://doi.org/10.1111/j.1365-2818.2006.01554.x.
MLA (9th ed.) CitationSW, Morgan, and Phillips MR. "Transient Analysis of Gaseous Electron-ion Recombination in the Environmental Scanning Electron Microscope." Journal of Microscopy, vol. 221, no. Pt 3, 2006, p. 183, https://doi.org/10.1111/j.1365-2818.2006.01554.x.