Transient analysis of gaseous electron-ion recombination in the environmental scanning electron microscope.
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| Title: | Transient analysis of gaseous electron-ion recombination in the environmental scanning electron microscope. |
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| Authors: | Morgan SW; Microstructural Analysis Unit, University of Technology, Sydney, NSW, Australia. scott.morgan@uts.edu.au, Phillips MR |
| Source: | Journal of microscopy [J Microsc] 2006 Mar; Vol. 221 (Pt 3), pp. 183-202. |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: Published for the Royal Microscopical Society by Blackwell Scientific Publications Country of Publication: England NLM ID: 0204522 Publication Model: Print Cited Medium: Print ISSN: 0022-2720 (Print) Linking ISSN: 00222720 NLM ISO Abbreviation: J Microsc Subsets: PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
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