W, S., CS, O., & LD, M. (2007). Application of a 2-beam model for improving the structure factors from precession electron diffraction intensities. Ultramicroscopy, 107(6-7), 543. https://doi.org/10.1016/j.ultramic.2006.02.008
Chicago Style (17th ed.) CitationW, Sinkler, Own CS, and Marks LD. "Application of a 2-beam Model for Improving the Structure Factors from Precession Electron Diffraction Intensities." Ultramicroscopy 107, no. 6-7 (2007): 543. https://doi.org/10.1016/j.ultramic.2006.02.008.
MLA (9th ed.) CitationW, Sinkler, et al. "Application of a 2-beam Model for Improving the Structure Factors from Precession Electron Diffraction Intensities." Ultramicroscopy, vol. 107, no. 6-7, 2007, p. 543, https://doi.org/10.1016/j.ultramic.2006.02.008.