Bibliographic Details
| Title: |
Application of a 2-beam model for improving the structure factors from precession electron diffraction intensities. |
| Authors: |
Sinkler W; UOP LLC, Des Plaines IL 60017, USA. csown@penelope.dhs.org , Own CS, Marks LD |
| Source: |
Ultramicroscopy [Ultramicroscopy] 2007 Jun-Jul; Vol. 107 (6-7), pp. 543-50. Date of Electronic Publication: 2006 Dec 20. |
| Publication Type: |
Journal Article |
| Journal Info: |
Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print-Electronic Cited Medium: Print ISSN: 0304-3991 (Print) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: PubMed not MEDLINE |
| Database: |
MEDLINE Ultimate |
