Bibliographic Details
| Title: |
An electron microscope for the aberration-corrected era. |
| Authors: |
Krivanek OL; Nion Co., 1102 8th Street, Kirkland, WA 98033, USA. krivanek.ondrej@gmail.com, Corbin GJ, Dellby N, Elston BF, Keyse RJ, Murfitt MF, Own CS, Szilagyi ZS, Woodruff JW |
| Source: |
Ultramicroscopy [Ultramicroscopy] 2008 Feb; Vol. 108 (3), pp. 179-95. Date of Electronic Publication: 2007 Oct 22. |
| Publication Type: |
Journal Article |
| Journal Info: |
Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print-Electronic Cited Medium: Print ISSN: 0304-3991 (Print) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: PubMed not MEDLINE |
| Database: |
MEDLINE Ultimate |
