An electron microscope for the aberration-corrected era.
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| Title: | An electron microscope for the aberration-corrected era. |
|---|---|
| Authors: | Krivanek OL; Nion Co., 1102 8th Street, Kirkland, WA 98033, USA. krivanek.ondrej@gmail.com, Corbin GJ, Dellby N, Elston BF, Keyse RJ, Murfitt MF, Own CS, Szilagyi ZS, Woodruff JW |
| Source: | Ultramicroscopy [Ultramicroscopy] 2008 Feb; Vol. 108 (3), pp. 179-95. Date of Electronic Publication: 2007 Oct 22. |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print-Electronic Cited Medium: Print ISSN: 0304-3991 (Print) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
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