SG, P., AI, B., DM, P., & KM, P. (2011). Mask-assisted deterministic phase-amplitude retrieval from a single far-field intensity diffraction pattern: Two experimental proofs of principle using visible light. Ultramicroscopy, 111(7), 782. https://doi.org/10.1016/j.ultramic.2011.01.011
Chicago Style (17th ed.) CitationSG, Podorov, Bishop AI, Paganin DM, and Pavlov KM. "Mask-assisted Deterministic Phase-amplitude Retrieval from a Single Far-field Intensity Diffraction Pattern: Two Experimental Proofs of Principle Using Visible Light." Ultramicroscopy 111, no. 7 (2011): 782. https://doi.org/10.1016/j.ultramic.2011.01.011.
MLA (9th ed.) CitationSG, Podorov, et al. "Mask-assisted Deterministic Phase-amplitude Retrieval from a Single Far-field Intensity Diffraction Pattern: Two Experimental Proofs of Principle Using Visible Light." Ultramicroscopy, vol. 111, no. 7, 2011, p. 782, https://doi.org/10.1016/j.ultramic.2011.01.011.