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Selective Purcell enhancement of defect emission in ZnO thin films.

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Title: Selective Purcell enhancement of defect emission in ZnO thin films.
Authors: Lawrie BJ; Department of Physics and Astronomy, Vanderbilt University, Nashville, Tennessee 37235, USA. lawriebj@ornl.gov, Mu R, Haglund RF Jr
Source: Optics letters [Opt Lett] 2012 May 01; Vol. 37 (9), pp. 1538-40.
Publication Type: Journal Article
Journal Info: Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 7708433 Publication Model: Print Cited Medium: Internet ISSN: 1539-4794 (Electronic) Linking ISSN: 01469592 NLM ISO Abbreviation: Opt Lett Subsets: PubMed not MEDLINE
Database: MEDLINE Ultimate
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Header DbId: mdl
DbLabel: MEDLINE Ultimate
An: 22555730
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Selective Purcell enhancement of defect emission in ZnO thin films.
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  Data: <searchLink fieldCode="AU" term="%22Lawrie+BJ%22">Lawrie BJ</searchLink>; Department of Physics and Astronomy, Vanderbilt University, Nashville, Tennessee 37235, USA. lawriebj@ornl.gov<br /><searchLink fieldCode="AU" term="%22Mu+R%22">Mu R</searchLink><br /><searchLink fieldCode="AU" term="%22Haglund+RF+Jr%22">Haglund RF Jr</searchLink>
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  Data: <searchLink fieldCode="JN" term="%227708433%22">Optics letters</searchLink> [Opt Lett] 2012 May 01; Vol. 37 (9), pp. 1538-40.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Optica+Publishing+Group%22">Optica Publishing Group </searchLink><i>Country of Publication: </i>United States <i>NLM ID: </i>7708433 <i>Publication Model: </i>Print <i>Cited Medium: </i>Internet <i>ISSN: </i>1539-4794 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2201469592%22">01469592 </searchLink><i>NLM ISO Abbreviation: </i>Opt Lett <i>Subsets: </i>PubMed not MEDLINE
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RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1364/OL.37.001538
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      – Code: eng
        Text: English
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        StartPage: 1538
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      – TitleFull: Selective Purcell enhancement of defect emission in ZnO thin films.
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            NameFull: Lawrie BJ
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            NameFull: Mu R
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            NameFull: Haglund RF Jr
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            – D: 01
              M: 05
              Text: 2012 May 01
              Type: published
              Y: 2012
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              Value: 1539-4794
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              Value: 37
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              Value: 9
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            – TitleFull: Optics letters
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