APA (7th ed.) Citation

LC, G., G, M., R, C., C, L., & AI, K. (2014). Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensor. Microscopy (Oxford, England), 63(2), 119. https://doi.org/10.1093/jmicro/dft051

Chicago Style (17th ed.) Citation

LC, Gontard, Moldovan G, Carmona-Galán R, Lin C, and Kirkland AI. "Detecting Single-electron Events in TEM Using Low-cost Electronics and a Silicon Strip Sensor." Microscopy (Oxford, England) 63, no. 2 (2014): 119. https://doi.org/10.1093/jmicro/dft051.

MLA (9th ed.) Citation

LC, Gontard, et al. "Detecting Single-electron Events in TEM Using Low-cost Electronics and a Silicon Strip Sensor." Microscopy (Oxford, England), vol. 63, no. 2, 2014, p. 119, https://doi.org/10.1093/jmicro/dft051.