Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensor.
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| Title: | Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensor. |
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| Authors: | Gontard LC; Department of Materials, University of Oxford, 16 Parks Road, Oxford OX1 3PH, UK., Moldovan G, Carmona-Galán R, Lin C, Kirkland AI |
| Source: | Microscopy (Oxford, England) [Microscopy (Oxf)] 2014 Apr; Vol. 63 (2), pp. 119-30. Date of Electronic Publication: 2014 Jan 08. |
| Publication Type: | Journal Article; Research Support, Non-U.S. Gov't |
| Journal Info: | Publisher: Oxford University Press Country of Publication: England NLM ID: 101595834 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 2050-5701 (Electronic) Linking ISSN: 20505698 NLM ISO Abbreviation: Microscopy (Oxf) Subsets: PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: mdl DbLabel: MEDLINE Ultimate An: 24401331 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensor. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Gontard+LC%22">Gontard LC</searchLink>; Department of Materials, University of Oxford, 16 Parks Road, Oxford OX1 3PH, UK.<br /><searchLink fieldCode="AU" term="%22Moldovan+G%22">Moldovan G</searchLink><br /><searchLink fieldCode="AU" term="%22Carmona-Galán+R%22">Carmona-Galán R</searchLink><br /><searchLink fieldCode="AU" term="%22Lin+C%22">Lin C</searchLink><br /><searchLink fieldCode="AU" term="%22Kirkland+AI%22">Kirkland AI</searchLink> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22101595834%22">Microscopy (Oxford, England)</searchLink> [Microscopy (Oxf)] 2014 Apr; Vol. 63 (2), pp. 119-30. <i>Date of Electronic Publication: </i>2014 Jan 08. – Name: TypePub Label: Publication Type Group: TypPub Data: Journal Article; Research Support, Non-U.S. Gov't – Name: TitleSource Label: Journal Info Group: Src Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Oxford+University+Press%22">Oxford University Press </searchLink><i>Country of Publication: </i>England <i>NLM ID: </i>101595834 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>2050-5701 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2220505698%22">20505698 </searchLink><i>NLM ISO Abbreviation: </i>Microscopy (Oxf) <i>Subsets: </i>PubMed not MEDLINE |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=mdl&AN=24401331 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1093/jmicro/dft051 Languages: – Code: eng Text: English PhysicalDescription: Pagination: StartPage: 119 Titles: – TitleFull: Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensor. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Gontard LC – PersonEntity: Name: NameFull: Moldovan G – PersonEntity: Name: NameFull: Carmona-Galán R – PersonEntity: Name: NameFull: Lin C – PersonEntity: Name: NameFull: Kirkland AI IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 04 Text: 2014 Apr Type: published Y: 2014 Identifiers: – Type: issn-electronic Value: 2050-5701 Numbering: – Type: volume Value: 63 – Type: issue Value: 2 Titles: – TitleFull: Microscopy (Oxford, England) Type: main |
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