Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensor.

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Bibliographic Details
Title: Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensor.
Authors: Gontard LC; Department of Materials, University of Oxford, 16 Parks Road, Oxford OX1 3PH, UK., Moldovan G, Carmona-Galán R, Lin C, Kirkland AI
Source: Microscopy (Oxford, England) [Microscopy (Oxf)] 2014 Apr; Vol. 63 (2), pp. 119-30. Date of Electronic Publication: 2014 Jan 08.
Publication Type: Journal Article; Research Support, Non-U.S. Gov't
Journal Info: Publisher: Oxford University Press Country of Publication: England NLM ID: 101595834 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 2050-5701 (Electronic) Linking ISSN: 20505698 NLM ISO Abbreviation: Microscopy (Oxf) Subsets: PubMed not MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:2050-5701
DOI:10.1093/jmicro/dft051