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Liquid phase electron-beam-induced deposition on bulk substrates using environmental scanning electron microscopy.

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Title: Liquid phase electron-beam-induced deposition on bulk substrates using environmental scanning electron microscopy.
Authors: Bresin M; 1 Department of Electrical and Computer Engineering, University of Kentucky, 453 F. Paul Anderson Tower, Lexington, KY 40506, USA., Botman A; 2 FEI Company, 5350 Dawson Creek Drive, Hillsboro, OR 97214, USA., Randolph SJ; 2 FEI Company, 5350 Dawson Creek Drive, Hillsboro, OR 97214, USA., Straw M; 2 FEI Company, 5350 Dawson Creek Drive, Hillsboro, OR 97214, USA., Hastings JT; 1 Department of Electrical and Computer Engineering, University of Kentucky, 453 F. Paul Anderson Tower, Lexington, KY 40506, USA.
Source: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2014 Apr; Vol. 20 (2), pp. 376-84. Date of Electronic Publication: 2014 Mar 03.
Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S.
Journal Info: Publisher: Oxford University Press Country of Publication: England NLM ID: 9712707 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1435-8115 (Electronic) Linking ISSN: 14319276 NLM ISO Abbreviation: Microsc Microanal Subsets: PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Data: <searchLink fieldCode="AU" term="%22Bresin+M%22">Bresin M</searchLink>; 1 Department of Electrical and Computer Engineering, University of Kentucky, 453 F. Paul Anderson Tower, Lexington, KY 40506, USA.<br /><searchLink fieldCode="AU" term="%22Botman+A%22">Botman A</searchLink>; 2 FEI Company, 5350 Dawson Creek Drive, Hillsboro, OR 97214, USA.<br /><searchLink fieldCode="AU" term="%22Randolph+SJ%22">Randolph SJ</searchLink>; 2 FEI Company, 5350 Dawson Creek Drive, Hillsboro, OR 97214, USA.<br /><searchLink fieldCode="AU" term="%22Straw+M%22">Straw M</searchLink>; 2 FEI Company, 5350 Dawson Creek Drive, Hillsboro, OR 97214, USA.<br /><searchLink fieldCode="AU" term="%22Hastings+JT%22">Hastings JT</searchLink>; 1 Department of Electrical and Computer Engineering, University of Kentucky, 453 F. Paul Anderson Tower, Lexington, KY 40506, USA.
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  Data: <searchLink fieldCode="JN" term="%229712707%22">Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada</searchLink> [Microsc Microanal] 2014 Apr; Vol. 20 (2), pp. 376-84. <i>Date of Electronic Publication: </i>2014 Mar 03.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Oxford+University+Press%22">Oxford University Press </searchLink><i>Country of Publication: </i>England <i>NLM ID: </i>9712707 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>1435-8115 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2214319276%22">14319276 </searchLink><i>NLM ISO Abbreviation: </i>Microsc Microanal <i>Subsets: </i>PubMed not MEDLINE
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        Value: 10.1017/S1431927614000117
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      – Code: eng
        Text: English
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              Text: 2014 Apr
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