Liquid phase electron-beam-induced deposition on bulk substrates using environmental scanning electron microscopy.

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Bibliographic Details
Title: Liquid phase electron-beam-induced deposition on bulk substrates using environmental scanning electron microscopy.
Authors: Bresin M; 1 Department of Electrical and Computer Engineering, University of Kentucky, 453 F. Paul Anderson Tower, Lexington, KY 40506, USA., Botman A; 2 FEI Company, 5350 Dawson Creek Drive, Hillsboro, OR 97214, USA., Randolph SJ; 2 FEI Company, 5350 Dawson Creek Drive, Hillsboro, OR 97214, USA., Straw M; 2 FEI Company, 5350 Dawson Creek Drive, Hillsboro, OR 97214, USA., Hastings JT; 1 Department of Electrical and Computer Engineering, University of Kentucky, 453 F. Paul Anderson Tower, Lexington, KY 40506, USA.
Source: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2014 Apr; Vol. 20 (2), pp. 376-84. Date of Electronic Publication: 2014 Mar 03.
Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S.
Journal Info: Publisher: Oxford University Press Country of Publication: England NLM ID: 9712707 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1435-8115 (Electronic) Linking ISSN: 14319276 NLM ISO Abbreviation: Microsc Microanal Subsets: PubMed not MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:1435-8115
DOI:10.1017/S1431927614000117