SMaSH: a benchmarking toolkit for human genome variant calling.

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Title: SMaSH: a benchmarking toolkit for human genome variant calling.
Authors: Talwalkar A; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA., Liptrap J; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA., Newcomb J; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA., Hartl C; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA., Terhorst J; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA., Curtis K; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA., Bresler M; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA., Song YS; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA., Jordan MI; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA., Patterson D; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA.
Source: Bioinformatics (Oxford, England) [Bioinformatics] 2014 Oct; Vol. 30 (19), pp. 2787-95. Date of Electronic Publication: 2014 Jun 03.
Publication Type: Journal Article; Research Support, N.I.H., Extramural; Research Support, U.S. Gov't, Non-P.H.S.
Journal Info: Publisher: Oxford University Press Country of Publication: England NLM ID: 9808944 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1367-4811 (Electronic) Linking ISSN: 13674803 NLM ISO Abbreviation: Bioinformatics Subsets: MEDLINE
Database: MEDLINE Ultimate
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  Data: SMaSH: a benchmarking toolkit for human genome variant calling.
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  Data: <searchLink fieldCode="AU" term="%22Talwalkar+A%22">Talwalkar A</searchLink>; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA.<br /><searchLink fieldCode="AU" term="%22Liptrap+J%22">Liptrap J</searchLink>; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA.<br /><searchLink fieldCode="AU" term="%22Newcomb+J%22">Newcomb J</searchLink>; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA.<br /><searchLink fieldCode="AU" term="%22Hartl+C%22">Hartl C</searchLink>; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA.<br /><searchLink fieldCode="AU" term="%22Terhorst+J%22">Terhorst J</searchLink>; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA.<br /><searchLink fieldCode="AU" term="%22Curtis+K%22">Curtis K</searchLink>; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA.<br /><searchLink fieldCode="AU" term="%22Bresler+M%22">Bresler M</searchLink>; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA.<br /><searchLink fieldCode="AU" term="%22Song+YS%22">Song YS</searchLink>; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA.<br /><searchLink fieldCode="AU" term="%22Jordan+MI%22">Jordan MI</searchLink>; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA.<br /><searchLink fieldCode="AU" term="%22Patterson+D%22">Patterson D</searchLink>; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA.
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  Data: <searchLink fieldCode="JN" term="%229808944%22">Bioinformatics (Oxford, England)</searchLink> [Bioinformatics] 2014 Oct; Vol. 30 (19), pp. 2787-95. <i>Date of Electronic Publication: </i>2014 Jun 03.
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              Text: 2014 Oct
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