| Authors: |
Xu Z; Electrical Engineering, Vanderbilt University, Nashville, TN, USA 37235., Burke RP; Biomedical Engineering, Vanderbilt University, Nashville, TN, USA 37235., Lee CP; Computer Science, Vanderbilt University, Nashville, TN, USA 37235., Baucom RB; General Surgery, Vanderbilt University, Nashville, TN, USA 37235., Poulose BK; General Surgery, Vanderbilt University, Nashville, TN, USA 37235., Abramson RG; Radiology and Radiological Science, Vanderbilt University, Nashville, TN, USA 37235., Landman BA; Electrical Engineering, Vanderbilt University, Nashville, TN, USA 37235 ; Biomedical Engineering, Vanderbilt University, Nashville, TN, USA 37235 ; Computer Science, Vanderbilt University, Nashville, TN, USA 37235 ; Radiology and Radiological Science, Vanderbilt University, Nashville, TN, USA 37235. |