APA (7th ed.) Citation

D, S., AK, S., K, S., GE, K., L, B., PC, S., . . . S, P. (2015). Microsecond-resolved SDR-based cavity ring down ellipsometry. Applied optics, 54(18), 5861. https://doi.org/10.1364/AO.54.005861

Chicago Style (17th ed.) Citation

D, Sofikitis, et al. "Microsecond-resolved SDR-based Cavity Ring Down Ellipsometry." Applied Optics 54, no. 18 (2015): 5861. https://doi.org/10.1364/AO.54.005861.

MLA (9th ed.) Citation

D, Sofikitis, et al. "Microsecond-resolved SDR-based Cavity Ring Down Ellipsometry." Applied Optics, vol. 54, no. 18, 2015, p. 5861, https://doi.org/10.1364/AO.54.005861.

Warning: These citations may not always be 100% accurate.