| Authors: |
Xu Z; Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN, USA 37235., Panjwani SA; Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN, USA 37235., Lee CP; Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN, USA 37235., Burke RP; Biomedical Engineering, Vanderbilt University, Nashville, TN, USA 37235., Baucom RB; General Surgery, Vanderbilt University, Nashville, TN 37235., Poulose BK; General Surgery, Vanderbilt University, Nashville, TN 37235., Abramson RG; Radiology and Radiological Science, Vanderbilt University, Nashville, TN 37235., Landman BA; Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN, USA 37235; Biomedical Engineering, Vanderbilt University, Nashville, TN, USA 37235; Radiology and Radiological Science, Vanderbilt University, Nashville, TN 37235. |