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An in situ correlative STEM-EDS and HRTEM based nanoscale chemical characterization of solid-liquid interfaces in an aluminium alloy.

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Title: An in situ correlative STEM-EDS and HRTEM based nanoscale chemical characterization of solid-liquid interfaces in an aluminium alloy.
Authors: Eswara S; Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology, Belvaux, Luxembourg. santhana.eswara@list.lu., Mitterbauer C; FEI Company, Achtseweg Noord 5, 5651, GG Eindhoven, The Netherlands., Wirtz T; Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology, Belvaux, Luxembourg., Kujawa S; FEI Company, Achtseweg Noord 5, 5651, GG Eindhoven, The Netherlands., Howe JM; Department of Materials Science & Engineering, University of Virginia, Charlottesville, Virginia, U.S.A.
Source: Journal of microscopy [J Microsc] 2016 Oct; Vol. 264 (1), pp. 64-70. Date of Electronic Publication: 2016 May 11.
Publication Type: Journal Article
Journal Info: Publisher: Published for the Royal Microscopical Society by Blackwell Scientific Publications Country of Publication: England NLM ID: 0204522 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1365-2818 (Electronic) Linking ISSN: 00222720 NLM ISO Abbreviation: J Microsc Subsets: PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Data: An in situ correlative STEM-EDS and HRTEM based nanoscale chemical characterization of solid-liquid interfaces in an aluminium alloy.
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  Data: <searchLink fieldCode="AU" term="%22Eswara+S%22">Eswara S</searchLink>; Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology, Belvaux, Luxembourg. santhana.eswara@list.lu.<br /><searchLink fieldCode="AU" term="%22Mitterbauer+C%22">Mitterbauer C</searchLink>; FEI Company, Achtseweg Noord 5, 5651, GG Eindhoven, The Netherlands.<br /><searchLink fieldCode="AU" term="%22Wirtz+T%22">Wirtz T</searchLink>; Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology, Belvaux, Luxembourg.<br /><searchLink fieldCode="AU" term="%22Kujawa+S%22">Kujawa S</searchLink>; FEI Company, Achtseweg Noord 5, 5651, GG Eindhoven, The Netherlands.<br /><searchLink fieldCode="AU" term="%22Howe+JM%22">Howe JM</searchLink>; Department of Materials Science & Engineering, University of Virginia, Charlottesville, Virginia, U.S.A.
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  Data: <searchLink fieldCode="JN" term="%220204522%22">Journal of microscopy</searchLink> [J Microsc] 2016 Oct; Vol. 264 (1), pp. 64-70. <i>Date of Electronic Publication: </i>2016 May 11.
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        Value: 10.1111/jmi.12417
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              Text: 2016 Oct
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