Bibliographic Details
| Title: |
Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization. |
| Authors: |
Van Well TL; Department of Physics, Central Michigan University., Redshaw M; Department of Physics, Central Michigan University; redsh1m@cmich.edu., Gamage ND; Department of Physics, Central Michigan University., Kandegedara RM; Department of Physics, Central Michigan University. |
| Source: |
Journal of visualized experiments : JoVE [J Vis Exp] 2016 Jul 12 (113). Date of Electronic Publication: 2016 Jul 12. |
| Publication Type: |
Journal Article; Video-Audio Media |
| Journal Info: |
Publisher: MYJoVE Corporation Country of Publication: United States NLM ID: 101313252 Publication Model: Electronic Cited Medium: Internet ISSN: 1940-087X (Electronic) Linking ISSN: 1940087X NLM ISO Abbreviation: J Vis Exp Subsets: MEDLINE |
| Database: |
MEDLINE Ultimate |
