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Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization.

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Title: Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization.
Authors: Van Well TL; Department of Physics, Central Michigan University., Redshaw M; Department of Physics, Central Michigan University; redsh1m@cmich.edu., Gamage ND; Department of Physics, Central Michigan University., Kandegedara RM; Department of Physics, Central Michigan University.
Source: Journal of visualized experiments : JoVE [J Vis Exp] 2016 Jul 12 (113). Date of Electronic Publication: 2016 Jul 12.
Publication Type: Journal Article; Video-Audio Media
Journal Info: Publisher: MYJoVE Corporation Country of Publication: United States NLM ID: 101313252 Publication Model: Electronic Cited Medium: Internet ISSN: 1940-087X (Electronic) Linking ISSN: 1940087X NLM ISO Abbreviation: J Vis Exp Subsets: MEDLINE
Database: MEDLINE Ultimate
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  Availability: 0
Header DbId: mdl
DbLabel: MEDLINE Ultimate
An: 27500824
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization.
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  Data: <searchLink fieldCode="AU" term="%22Van+Well+TL%22">Van Well TL</searchLink>; Department of Physics, Central Michigan University.<br /><searchLink fieldCode="AU" term="%22Redshaw+M%22">Redshaw M</searchLink>; Department of Physics, Central Michigan University; redsh1m@cmich.edu.<br /><searchLink fieldCode="AU" term="%22Gamage+ND%22">Gamage ND</searchLink>; Department of Physics, Central Michigan University.<br /><searchLink fieldCode="AU" term="%22Kandegedara+RM%22">Kandegedara RM</searchLink>; Department of Physics, Central Michigan University.
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  Data: <searchLink fieldCode="JN" term="%22101313252%22">Journal of visualized experiments : JoVE</searchLink> [J Vis Exp] 2016 Jul 12 (113). <i>Date of Electronic Publication: </i>2016 Jul 12.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22MYJoVE+Corporation%22">MYJoVE Corporation </searchLink><i>Country of Publication: </i>United States <i>NLM ID: </i>101313252 <i>Publication Model: </i>Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>1940-087X (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%221940087X%22">1940087X </searchLink><i>NLM ISO Abbreviation: </i>J Vis Exp <i>Subsets: </i>MEDLINE
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=mdl&AN=27500824
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.3791/54030
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      – Code: eng
        Text: English
    Titles:
      – TitleFull: Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization.
        Type: main
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      – PersonEntity:
          Name:
            NameFull: Van Well TL
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            NameFull: Redshaw M
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            NameFull: Gamage ND
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            NameFull: Kandegedara RM
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          Dates:
            – D: 12
              M: 07
              Text: 2016 Jul 12
              Type: published
              Y: 2016
          Identifiers:
            – Type: issn-electronic
              Value: 1940-087X
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              Value: 113
          Titles:
            – TitleFull: Journal of visualized experiments : JoVE
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