Differences in the nanoscale electrical properties of GaN films grown on sapphire and ZnO substrates by molecular beam epitaxy.

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Title: Differences in the nanoscale electrical properties of GaN films grown on sapphire and ZnO substrates by molecular beam epitaxy.
Authors: Chen SH; Department of Electrophysics, National Chiayi University, Chiayi, 600, Taiwan., Su CW; Department of Electrophysics, National Chiayi University, Chiayi, 600, Taiwan., Chang LH; Department of Electrophysics, National Chiayi University, Chiayi, 600, Taiwan., Tsai TH; Department of Electrophysics, National Chiayi University, Chiayi, 600, Taiwan.
Source: Microscopy research and technique [Microsc Res Tech] 2017 Jul; Vol. 80 (7), pp. 731-736. Date of Electronic Publication: 2017 Feb 28.
Publication Type: Journal Article
Journal Info: Publisher: Wiley-Liss Country of Publication: United States NLM ID: 9203012 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1097-0029 (Electronic) Linking ISSN: 1059910X NLM ISO Abbreviation: Microsc Res Tech Subsets: PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Data: Differences in the nanoscale electrical properties of GaN films grown on sapphire and ZnO substrates by molecular beam epitaxy.
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  Data: <searchLink fieldCode="AU" term="%22Chen+SH%22">Chen SH</searchLink>; Department of Electrophysics, National Chiayi University, Chiayi, 600, Taiwan.<br /><searchLink fieldCode="AU" term="%22Su+CW%22">Su CW</searchLink>; Department of Electrophysics, National Chiayi University, Chiayi, 600, Taiwan.<br /><searchLink fieldCode="AU" term="%22Chang+LH%22">Chang LH</searchLink>; Department of Electrophysics, National Chiayi University, Chiayi, 600, Taiwan.<br /><searchLink fieldCode="AU" term="%22Tsai+TH%22">Tsai TH</searchLink>; Department of Electrophysics, National Chiayi University, Chiayi, 600, Taiwan.
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  Data: <searchLink fieldCode="JN" term="%229203012%22">Microscopy research and technique</searchLink> [Microsc Res Tech] 2017 Jul; Vol. 80 (7), pp. 731-736. <i>Date of Electronic Publication: </i>2017 Feb 28.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Wiley-Liss%22">Wiley-Liss </searchLink><i>Country of Publication: </i>United States <i>NLM ID: </i>9203012 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>1097-0029 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%221059910X%22">1059910X </searchLink><i>NLM ISO Abbreviation: </i>Microsc Res Tech <i>Subsets: </i>PubMed not MEDLINE
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RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1002/jemt.22858
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      – Code: eng
        Text: English
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        StartPage: 731
    Titles:
      – TitleFull: Differences in the nanoscale electrical properties of GaN films grown on sapphire and ZnO substrates by molecular beam epitaxy.
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            NameFull: Chen SH
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            NameFull: Su CW
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            NameFull: Chang LH
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            NameFull: Tsai TH
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            – D: 01
              M: 07
              Text: 2017 Jul
              Type: published
              Y: 2017
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              Value: 1097-0029
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              Value: 80
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              Value: 7
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            – TitleFull: Microscopy research and technique
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