Bibliographic Details
| Title: |
Nanometric Integrated Temperature and Thermal Sensors in CMOS-SOI Technology. |
| Authors: |
Malits M; Department of Electrical Engineering, Technion-Israel Institute of Technology, Haifa 3200003, Israel. maria.malits@gmail.com., Nemirovsky Y; Department of Electrical Engineering, Technion-Israel Institute of Technology, Haifa 3200003, Israel. nemirov@ee.technion.ac.il. |
| Source: |
Sensors (Basel, Switzerland) [Sensors (Basel)] 2017 Jul 29; Vol. 17 (8). Date of Electronic Publication: 2017 Jul 29. |
| Publication Type: |
Journal Article |
| Journal Info: |
Publisher: MDPI Country of Publication: Switzerland NLM ID: 101204366 Publication Model: Electronic Cited Medium: Internet ISSN: 1424-8220 (Electronic) Linking ISSN: 14248220 NLM ISO Abbreviation: Sensors (Basel) Subsets: PubMed not MEDLINE |
| Database: |
MEDLINE Ultimate |
