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Asymmetric and Symmetric Unbiased Image Registration: Statistical Assessment of Performance.

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Title: Asymmetric and Symmetric Unbiased Image Registration: Statistical Assessment of Performance.
Authors: Yanovsky I; Department of Mathematics, University of California, Los Angeles, CA 90095., Thompson PM; Laboratory of Neuro Imaging, UCLA School of Medicine, Los Angeles, CA 90095., Osher S; Department of Mathematics, University of California, Los Angeles, CA 90095., Leow AD; Laboratory of Neuro Imaging, UCLA School of Medicine, Los Angeles, CA 90095.
Source: Conference on Computer Vision and Pattern Recognition Workshops. IEEE Computer Society Conference on Computer Vision and Pattern Recognition. Workshops [Conf Comput Vis Pattern Recognit Workshops] 2008 Jun; Vol. 2008. Date of Electronic Publication: 2008 Jul 15.
Publication Type: Journal Article
Journal Info: Publisher: Institute of Electrical and Electronics Engineers Country of Publication: United States NLM ID: 101554644 Publication Model: Print-Electronic Cited Medium: Print ISSN: 2160-7508 (Print) Linking ISSN: 21607508 NLM ISO Abbreviation: Conf Comput Vis Pattern Recognit Workshops Subsets: PubMed not MEDLINE
Database: MEDLINE Ultimate
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PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Asymmetric and Symmetric Unbiased Image Registration: Statistical Assessment of Performance.
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  Data: <searchLink fieldCode="AU" term="%22Yanovsky+I%22">Yanovsky I</searchLink>; Department of Mathematics, University of California, Los Angeles, CA 90095.<br /><searchLink fieldCode="AU" term="%22Thompson+PM%22">Thompson PM</searchLink>; Laboratory of Neuro Imaging, UCLA School of Medicine, Los Angeles, CA 90095.<br /><searchLink fieldCode="AU" term="%22Osher+S%22">Osher S</searchLink>; Department of Mathematics, University of California, Los Angeles, CA 90095.<br /><searchLink fieldCode="AU" term="%22Leow+AD%22">Leow AD</searchLink>; Laboratory of Neuro Imaging, UCLA School of Medicine, Los Angeles, CA 90095.
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  Data: <searchLink fieldCode="JN" term="%22101554644%22">Conference on Computer Vision and Pattern Recognition Workshops. IEEE Computer Society Conference on Computer Vision and Pattern Recognition. Workshops</searchLink> [Conf Comput Vis Pattern Recognit Workshops] 2008 Jun; Vol. 2008. <i>Date of Electronic Publication: </i>2008 Jul 15.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Institute+of+Electrical+and+Electronics+Engineers%22">Institute of Electrical and Electronics Engineers </searchLink><i>Country of Publication: </i>United States <i>NLM ID: </i>101554644 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Print <i>ISSN: </i>2160-7508 (Print) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2221607508%22">21607508 </searchLink><i>NLM ISO Abbreviation: </i>Conf Comput Vis Pattern Recognit Workshops <i>Subsets: </i>PubMed not MEDLINE
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=mdl&AN=29152411
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      – Type: doi
        Value: 10.1109/CVPRW.2008.4562988
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      – Code: eng
        Text: English
    Titles:
      – TitleFull: Asymmetric and Symmetric Unbiased Image Registration: Statistical Assessment of Performance.
        Type: main
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            NameFull: Yanovsky I
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            NameFull: Thompson PM
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            NameFull: Osher S
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            NameFull: Leow AD
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          Dates:
            – D: 01
              M: 06
              Text: 2008 Jun
              Type: published
              Y: 2008
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            – Type: issn-print
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              Value: 2008
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            – TitleFull: Conference on Computer Vision and Pattern Recognition Workshops. IEEE Computer Society Conference on Computer Vision and Pattern Recognition. Workshops
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