Recovery Mechanism of Degraded Black Phosphorus Field-Effect Transistors by 1,2-Ethanedithiol Chemistry and Extended Device Stability.

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Title: Recovery Mechanism of Degraded Black Phosphorus Field-Effect Transistors by 1,2-Ethanedithiol Chemistry and Extended Device Stability.
Authors: Kwak DH; Department of Energy Science and Engineering, DGIST, Daegu, 42988, Republic of Korea., Ra HS; Department of Energy Science and Engineering, DGIST, Daegu, 42988, Republic of Korea., Yang J; School of Materials Science and Engineering, GIST, Gwangju, 61005, Republic of Korea., Jeong MH; Department of Energy Science and Engineering, DGIST, Daegu, 42988, Republic of Korea., Lee AY; Department of Energy Science and Engineering, DGIST, Daegu, 42988, Republic of Korea., Lee W; Institute of Advanced Composite Materials, Korea Institute of Science and Technology, 92 Chudong-ro, Bongdong-eup, Wanju-gun, Jeonbuk, 55324, Republic of Korea., Hwang JY; Institute of Advanced Composite Materials, Korea Institute of Science and Technology, 92 Chudong-ro, Bongdong-eup, Wanju-gun, Jeonbuk, 55324, Republic of Korea., Lee JH; School of Materials Science and Engineering, GIST, Gwangju, 61005, Republic of Korea., Lee JS; Department of Energy Science and Engineering, DGIST, Daegu, 42988, Republic of Korea.
Source: Small (Weinheim an der Bergstrasse, Germany) [Small] 2018 Feb; Vol. 14 (6). Date of Electronic Publication: 2017 Dec 06.
Publication Type: Journal Article; Research Support, Non-U.S. Gov't
Journal Info: Publisher: Wiley-VCH Country of Publication: Germany NLM ID: 101235338 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1613-6829 (Electronic) Linking ISSN: 16136810 NLM ISO Abbreviation: Small Subsets: PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Data: Recovery Mechanism of Degraded Black Phosphorus Field-Effect Transistors by 1,2-Ethanedithiol Chemistry and Extended Device Stability.
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  Data: <searchLink fieldCode="AU" term="%22Kwak+DH%22">Kwak DH</searchLink>; Department of Energy Science and Engineering, DGIST, Daegu, 42988, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Ra+HS%22">Ra HS</searchLink>; Department of Energy Science and Engineering, DGIST, Daegu, 42988, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Yang+J%22">Yang J</searchLink>; School of Materials Science and Engineering, GIST, Gwangju, 61005, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Jeong+MH%22">Jeong MH</searchLink>; Department of Energy Science and Engineering, DGIST, Daegu, 42988, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Lee+AY%22">Lee AY</searchLink>; Department of Energy Science and Engineering, DGIST, Daegu, 42988, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Lee+W%22">Lee W</searchLink>; Institute of Advanced Composite Materials, Korea Institute of Science and Technology, 92 Chudong-ro, Bongdong-eup, Wanju-gun, Jeonbuk, 55324, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Hwang+JY%22">Hwang JY</searchLink>; Institute of Advanced Composite Materials, Korea Institute of Science and Technology, 92 Chudong-ro, Bongdong-eup, Wanju-gun, Jeonbuk, 55324, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Lee+JH%22">Lee JH</searchLink>; School of Materials Science and Engineering, GIST, Gwangju, 61005, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Lee+JS%22">Lee JS</searchLink>; Department of Energy Science and Engineering, DGIST, Daegu, 42988, Republic of Korea.
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  Data: <searchLink fieldCode="JN" term="%22101235338%22">Small (Weinheim an der Bergstrasse, Germany)</searchLink> [Small] 2018 Feb; Vol. 14 (6). <i>Date of Electronic Publication: </i>2017 Dec 06.
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  Data: Journal Article; Research Support, Non-U.S. Gov't
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Wiley-VCH%22">Wiley-VCH </searchLink><i>Country of Publication: </i>Germany <i>NLM ID: </i>101235338 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>1613-6829 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2216136810%22">16136810 </searchLink><i>NLM ISO Abbreviation: </i>Small <i>Subsets: </i>PubMed not MEDLINE
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        Value: 10.1002/smll.201703194
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        Text: English
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      – TitleFull: Recovery Mechanism of Degraded Black Phosphorus Field-Effect Transistors by 1,2-Ethanedithiol Chemistry and Extended Device Stability.
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            NameFull: Kwak DH
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              M: 02
              Text: 2018 Feb
              Type: published
              Y: 2018
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