| Authors: |
Ardila-Rey JA; Department of Electrical Engineering, Universidad Técnica Federico Santa María, Av. Vicuña Mackenna 3939, Santiago de Chile 8940000, Chile. jorge.ardila@usm.cl., Montaña J; Department of Electrical Engineering, Universidad Técnica Federico Santa María, Av. España 1680, Valparaiso 2340000, Chile. johny.montana@usm.cl., de Castro BA; Department of Electrical Engineering, São Paulo State University, Av. Eng. Luiz Edmundo Carrijo Coube 14-01, Bauru 17033-360, Brazil. bruno.castro@unesp.br., Schurch R; Department of Electrical Engineering, Universidad Técnica Federico Santa María, Av. España 1680, Valparaiso 2340000, Chile. roger.schurch@usm.cl., Covolan Ulson JA; Department of Electrical Engineering, São Paulo State University, Av. Eng. Luiz Edmundo Carrijo Coube 14-01, Bauru 17033-360, Brazil. alfredo.ulson@unesp.br., Muhammad-Sukki F; School of Engineering, Robert Gordon University, Garthdee Road, Aberdeen AB10 7GJ, UK. f.b.muhammad-sukki@rgu.ac.uk., Bani NA; UTM Razak School of Engineering and Advanced Technology, Universiti Teknologi Malaysia, Kuala Lumpur 54100, Malaysia. nurulaini.kl@utm.my. |